Structural Characterization of (Re)Bco Layer Deposited by Pld and Mocvd Techniques
, e | 25 nov 2014
INFORMAZIONI SU QUESTO ARTICOLO
Pubblicato online: 25 nov 2014
Pagine: 137 - 142
DOI: https://doi.org/10.2478/rput-2014-0020
Parole chiave
© by Jozef Mišík
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.
(RE)BCO thin films prepared by PLD and MOCVD techniques were investigated to characterize structural defects - outgrowths in thin film. For this purpose SEM, EDX analysis and LSCM were used. Outgrowths are often penetrating into the thin films. Evident differences in chemical heterogeneity, outgrowth morphology and outgrowths density between PLD and MOCVD thin films were proven in this study.