Accesso libero

Research on the Measurement System and Remote Calibration Technology of a Dual Linear Array Camera

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Cita

Bin Feng
School of Optoelectronic Engineering Xi’an Technological UniversityXi’an, China
Zaiming Liu
School of Optoelectronic Engineering Xi’an Technological UniversityXi’an, China
Haofei Zhang
No.208 Research Institute of China Ordnance IndustriesBeijing, China
Haozhe Fan
School of Optoelectronic Engineering Xi’an Technological UniversityXi’an, China
eISSN:
1335-8871
Lingua:
Inglese
Frequenza di pubblicazione:
6 volte all'anno
Argomenti della rivista:
Engineering, Electrical Engineering, Control Engineering, Metrology and Testing