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Measurement Approach to Evaluation of Ultra-Low-Voltage Amplifier ASICs

Richard Ravasz

Richard Ravasz

Department of IC Design and Test, Faculty of Electrical Engineering and Information Technology, Slovak University of TechnologyBratislava, Slovakia
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Ravasz, Richard
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Miroslav Potočný

Miroslav Potočný

Department of IC Design and Test, Faculty of Electrical Engineering and Information Technology, Slovak University of TechnologyBratislava, Slovakia
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Potočný, Miroslav
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Daniel Arbet

Daniel Arbet

Department of IC Design and Test, Faculty of Electrical Engineering and Information Technology, Slovak University of TechnologyBratislava, Slovakia
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Arbet, Daniel
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Martin Kováč

Martin Kováč

Department of IC Design and Test, Faculty of Electrical Engineering and Information Technology, Slovak University of TechnologyBratislava, Slovakia
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Kováč, Martin
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David Maljar

David Maljar

Department of IC Design and Test, Faculty of Electrical Engineering and Information Technology, Slovak University of TechnologyBratislava, Slovakia
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Maljar, David
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Lukáš Nagy

Lukáš Nagy

Department of IC Design and Test, Faculty of Electrical Engineering and Information Technology, Slovak University of TechnologyBratislava, Slovakia
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Nagy, Lukáš
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Viera Stopjaková

Viera Stopjaková

Department of IC Design and Test, Faculty of Electrical Engineering and Information Technology, Slovak University of TechnologyBratislava, Slovakia
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Stopjaková, Viera
  
07 mar 2024
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Pubblicato online: 07 mar 2024
Pagine: 9 - 16
Ricevuto: 02 lug 2023
Accettato: 25 ott 2023
DOI: https://doi.org/10.2478/msr-2024-0002
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© 2024 Richard Ravasz et al., published by Sciendo
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.
Ravasz, Richard
Department of IC Design and Test, Faculty of Electrical Engineering and Information Technology, Slovak University of TechnologyBratislava, Slovakia
Potočný, Miroslav
Department of IC Design and Test, Faculty of Electrical Engineering and Information Technology, Slovak University of TechnologyBratislava, Slovakia
Arbet, Daniel
Department of IC Design and Test, Faculty of Electrical Engineering and Information Technology, Slovak University of TechnologyBratislava, Slovakia
Kováč, Martin
Department of IC Design and Test, Faculty of Electrical Engineering and Information Technology, Slovak University of TechnologyBratislava, Slovakia
Maljar, David
Department of IC Design and Test, Faculty of Electrical Engineering and Information Technology, Slovak University of TechnologyBratislava, Slovakia
Nagy, Lukáš
Department of IC Design and Test, Faculty of Electrical Engineering and Information Technology, Slovak University of TechnologyBratislava, Slovakia
Stopjaková, Viera
Department of IC Design and Test, Faculty of Electrical Engineering and Information Technology, Slovak University of TechnologyBratislava, Slovakia
Lingua:
Inglese
Frequenza di pubblicazione:
6 volte all'anno
Argomenti della rivista:
Ingegneria, Elettrotecnica, Ingegneria dell'automazione, metrologia e collaudo
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