INFORMAZIONI SU QUESTO ARTICOLO

Cita

Liping Tian
School of network and communication engineering, Jinling Institute of TechnologyChina
Key Laboratory of of Transient Optics and Photonics, Key Laboratory of Ultra-fast Photoelectric Diagnostics Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences China
Lingbin Shen
School of network and communication engineering, Jinling Institute of TechnologyChina
Lin Chen
School of network and communication engineering, Jinling Institute of TechnologyChina
Lili Li
Key Laboratory of of Transient Optics and Photonics, Key Laboratory of Ultra-fast Photoelectric Diagnostics Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences China
Jinshou Tian
Key Laboratory of of Transient Optics and Photonics, Key Laboratory of Ultra-fast Photoelectric Diagnostics Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences China
Ping Chen
Key Laboratory of of Transient Optics and Photonics, Key Laboratory of Ultra-fast Photoelectric Diagnostics Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences China
Wei Zhao
Key Laboratory of of Transient Optics and Photonics, Key Laboratory of Ultra-fast Photoelectric Diagnostics Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences China
eISSN:
1335-8871
Lingua:
Inglese
Frequenza di pubblicazione:
6 volte all'anno
Argomenti della rivista:
Engineering, Electrical Engineering, Control Engineering, Metrology and Testing