Surface micromorphology characterization of PDI8-CN2 thin films on H-Si by AFM analysis
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06 ott 2020
INFORMAZIONI SU QUESTO ARTICOLO
Pubblicato online: 06 ott 2020
Pagine: 334 - 340
Ricevuto: 21 ago 2018
Accettato: 23 apr 2019
DOI: https://doi.org/10.2478/msp-2020-0033
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© 2020 Ştefan Ţălu et al., published by Sciendo
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.
Ţălu, Ştefan
Technical University of Cluj-Napoca, The Directorate of Research, Development and Innovation Management (DMCDI)Romania
Kulesza, Slawomir
University of Warmia and Mazury in Olsztyn, Faculty of Technical SciencesOlsztyn, Poland
Bramowicz, Miroslaw
University of Warmia and Mazury in Olsztyn, Faculty of Technical SciencesOlsztyn, Poland
Solaymani, Shahram
Department of Physics, Kermanshah Branch, Islamic Azad UniversityKermanshah
Ţălu, Mihai
University of Craiova, Faculty of Mechanics, Department of Applied Mechanics and Civil EngineeringRomania
Nezafat, Negin Beryani
Department of Physics, Kermanshah Branch, Islamic Azad UniversityKermanshah
Rezaee, Sahar
Department of Physics, Kermanshah Branch, Islamic Azad UniversityKermanshah