Some remarks on the paper “Optimization of S:Sn precursor molar concentration on the physical properties of spray deposited single phase Sn₂S₃ thin films” by J. Srivind, V.S. Nagaretthinam, A.R. Balu [Mater. Sci.-Poland, 34 (2016), 393 – 398]

Pubblicato online: 12 dic 2020

Pagine: 400 - 401

Ricevuto: 14 apr 2018

Accettato: 13 nov 2018

DOI: https://doi.org/10.2478/msp-2018-0101

Parole chiave

X-ray diffraction, thin films, errors, SnS

© 2020 Paweł E. Tomaszewski, published by Sciendo

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.