Accesso libero

Fault diagnosis of analogue circuits based on artificial intelligence algorithms

   | 18 nov 2023
INFORMAZIONI SU QUESTO ARTICOLO

Cita

Kuhns, NathanCaley, LandonRahman, AshfaqurAhmed, ShamimDi, JiaMantooth, H. AlanFrancis, A. MatthewHolmes, James. (2017). Complex high-temperature cmos silicon carbide digital circuit designs. SIAM journal on applied dynamical systems, 16(2). Search in Google Scholar

Eslami, M., Ghavami, B., Raji, M., & Mahani, A. (2020). A survey on fault injection methods of digital integrated circuits. Integration the VLSI Journal, 71, 154-163. Search in Google Scholar

Ohira, T. (2017). The kq product as viewed by an analog circuit engineer. IEEE Circuits & Systems Magazine, 17(1), 27-32. Search in Google Scholar

Romijn, J., Vollebregt, S., Middelburg, L. M., Mansouri, B. E., Zeijl, H. W. V., & May, A., et al. (2022). Integrated digital and analog circuit blocks in a scalable silicon carbide cmos technology. IEEE Transactions on Electron Devices. (1), 69. Search in Google Scholar

Yang, Z., & Yin, R. (2017). Design and research of electronic circuit fault diagnosis based on artificial intelligence. Revista de la Facultad de Ingenieria, 32(12), 766-772. Search in Google Scholar

Peng, T., Zhao, S., Dan, H. B., & Yu, H. X. (2017). Open-circuit fault diagnosis and fault tolerance for shunt active power filter. Journal of Central South University, 24(11), 2582-2595. Search in Google Scholar

Chunteng, L., Yuzhong, J., & Fangjun, L. (2018). New insights about interference suppression algorithm based on analog circuits and linear filtering method in elf communication. AEU - International Journal of Electronics and Communications, 93, 154-162. Search in Google Scholar

Binu, D., & Kariyappa, B. S. (2017). A survey on fault diagnosis of analog circuits: taxonomy and state of the art. AEU - International Journal of Electronics and Communications, 73, 68-83. Search in Google Scholar

Arabi, A., Bourouba, N., Belaout, A., & Ayad, M. (2019). An accurate classifier based on adaptive neuro-fuzzy and features selection techniques for fault classification in analog circuits. Integration, 64(JAN.), 50-59. Search in Google Scholar

Tadeusiewicz, M., & Hagas, S. (2019). Soft fault diagnosis of linear circuits with the special attention paid to the circuits containing current conveyors. AEU - International Journal of Electronics and Communications, 115, 153036. Search in Google Scholar

Shokrolahi, S. M., & Kazempour, A. T. N. (2019). A novel approach for fault detection of analog circuit by using improved EEMD. Analog Integrated Circuits and Signal Processing, 98(3), 527-534. Search in Google Scholar

Liu, K. (2022). Soft fault diagnosis of analog circuit based on eemd and improved mf-dfa. Electronics, 12. Search in Google Scholar

Guo, Y. (2021). Analog circuit fault diagnosis based on support vector machine classifier and fuzzy feature selection. Electronics, 10. Search in Google Scholar

Chen, K. (2021). Analog circuit fault diagnosis using a novel variant of aconvolutional neural network. Algorithms, 15. Search in Google Scholar

Shi, J., Deng, Y., & Wang, Z. (2020). Analog circuit fault diagnosis based on density peaks clustering and dynamic weight probabilistic neural network. Neurocomputing, 407. Search in Google Scholar

Du, T., Zhang, H., & Wang, L. (2019). Analogue circuit fault diagnosis based on convolution neural network. Electronics Letters, 55(24). Search in Google Scholar

Qingfeng, M., Yuzhu, H., Fuqiang, Z., & Ping, S. (2018). Test point selection method for analog circuit fault diagnosis based on similarity coefficient. Mathematical Problems in Engineering, 2018(PT.2), 1-11. Search in Google Scholar

Gao, T. Y., Yang, J. L., Jiang, S. D., & Yang, C. (2019). A novel fault diagnostic method for analog circuits using frequency response features. Review of Scientific Instruments, 90(10), 104708. Search in Google Scholar

Yang, Y., Wang, L., Nie, X., & Wang, Y. (2021). Incipient fault diagnosis of analog circuits based on wavelet transform and improved deep convolutional neural network. IEICE Electronics Express. (13). Search in Google Scholar

eISSN:
2444-8656
Lingua:
Inglese
Frequenza di pubblicazione:
Volume Open
Argomenti della rivista:
Life Sciences, other, Mathematics, Applied Mathematics, General Mathematics, Physics