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On–The–Fly Diagnosability Analysis of Bounded and Unbounded Labeled Petri Nets Using Verifier Nets

International Journal of Applied Mathematics and Computer Science's Cover Image
International Journal of Applied Mathematics and Computer Science
Advanced Diagnosis and Fault-Tolerant Control Methods (special section, pp. 233-333), Vicenç Puig, Dominique Sauter, Christophe Aubrun, Horst Schulte (Eds.)
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Cita

Ben Li
Centrale Lille, 59650Villeneuve d’Ascq, France
Manel Khlif-Bouassida
Cristal, UMR 9189 Centrale Lille, 59650Villeneuve d’Ascq, France
Armand Toguyéni
Cristal, UMR 9189 Centrale Lille, 59650Villeneuve d’Ascq, France
eISSN:
2083-8492
Lingua:
Inglese
Frequenza di pubblicazione:
4 volte all'anno
Argomenti della rivista:
Mathematics, Applied Mathematics