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Bivariate Hahn moments for image reconstruction

International Journal of Applied Mathematics and Computer Science's Cover Image
International Journal of Applied Mathematics and Computer Science
Signals and Systems (special section, pp. 233-312), Ryszard Makowski and Jan Zarzycki (Eds.)
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eISSN:
2083-8492
Lingua:
Inglese
Frequenza di pubblicazione:
4 volte all'anno
Argomenti della rivista:
Mathematics, Applied Mathematics