INFORMAZIONI SU QUESTO ARTICOLO

Cita

Maciej Trawka
Department of Metrology and Optoelectronics Faculty of ETI, Gdansk University of Technology GdanskGdansk, Poland
Janusz Smulko
Department of Metrology and Optoelectronics Faculty of ETI, Gdansk University of Technology GdanskGdansk, Poland
Lech Hasse
Claes G. Granqvist
Department of Engineering Sciences The Ångström Laboratory, Uppsala University UppsalaUppsala, Sweden
Radu Ionescu
Department of Electronics Rovira i Virgily University TarragonaTarragona, Spain
Fatima E. Annanouch
Department of Electronics Rovira i Virgily University TarragonaTarragona, Spain
Eduard Llobet ETSE-DEEEA
Department of Electronics Rovira i Virgily University TarragonaTarragona, Spain
Laszlo B. Kish
Department of Electrical & Computer Engineering Texas A&M University TexasTexas, USA
eISSN:
1178-5608
Lingua:
Inglese
Frequenza di pubblicazione:
Volume Open
Argomenti della rivista:
Engineering, Introductions and Overviews, other