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Deep Learning in Product Manufacturing Record System

Wenjing Wang
Wenjing Wang
 e 
Li Zhao
Li Zhao
   | 22 feb 2022
International Journal of Advanced Network, Monitoring and Controls's Cover Image
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Pubblicato online: 22 feb 2022
Pagine: 59 - 65
DOI: https://doi.org/10.21307/ijanmc-2021-028
Parole chiave
© 2021 Wenjing Wang et al., published by Sciendo
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.

Figure 1.

Convolution operation
Convolution operation

Figure 2.

CBRP module structure
CBRP module structure

Figure 3.

Stacked LSTM structure
Stacked LSTM structure

Figure 4.

CNN-LSTM network model
CNN-LSTM network model

Figure 5.

Inception module structure
Inception module structure

Figure 6.

INCEPTION-GRU network model
INCEPTION-GRU network model

Figure 7.

INCEPTION-GRU network model
INCEPTION-GRU network model

Results of data processing of test records

Xh Czry Jcry Wlh Bbh Mc Ms
5 0 0 0 0 0 1
3 1 1 1 0 1 0
3 2 1 0 0 1 0
5 3 2 2 0 0 0
5 4 0 0 0 0 1
3 3 1 1 0 1 0
3 5 1 3 0 1 0
3 5 1 3 0 1 0
5 6 3 3 0 0 0
5 5 4 2 0 0 0
3 5 1 3 0 1 0
3 5 1 3 0 1 0
5 7 0 1 0 0 0
3 2 1 0 0 1 0
5 8 5 2 0 0 1
3 6 1 1 0 1 0
3 5 1 3 0 1 0

Comparison of network model accuracy (%)

Network Model 1 2 3
CNN-STACK LSTM 92.33 92.50 92.78
INCEPTION-GRU 92.6 93.50 93.28
INCEPTION-Casual LSTM 83.83 79.67 94.25

Data structure of test records

Field Annotation Data Type Is The Pk
id Self-adding id Int (32) yes
txm barcode varchar (40) no
probbh_id Product version id Int (32) no
cpjcjd_id Product process id Int (32) no
lx types Int (2) no
xh Work serial number Int (2) no
czry debuggers varchar (20) no
jcry Testers varchar (20) no
wlh Material number varchar (20) no
wlms Material Description varchar (200) no
dd Order Number varchar (30) no
bbh version number varchar (50) no
mc Name of work process varchar (30) no
ms description varchar (60) no
create_date Creation time date no
create_username Create User varchar (60) no
eISSN:
2470-8038
Lingua:
Inglese
Frequenza di pubblicazione:
4 volte all'anno
Argomenti della rivista:
Computer Sciences, other
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