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Properties of thin ZnS:Mn films sprayed by improved method: The role of Mn2+ ion concentration

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[1] NAKAMURA S., YAMADA Y., TAGUCHI T., J. Cryst. Growth, 214 (2000), 1091.10.1016/S0022-0248(00)00280-3Search in Google Scholar

[2] ELIDRISSI B., ADDOU M., REGRAGUI M., BOUGRINE A., KACHOUANE A., BERNEDE J.C., Mater. Chem. Phys., 68 (2001), 175.10.1016/S0254-0584(00)00351-5Search in Google Scholar

[3] QI L., LEE B.I., KIM J.M., JANG J.E., CHOE J.Y., J. Lumin., 104 (2003), 261.10.1016/S0022-2313(03)00079-6Search in Google Scholar

[4] WANG Z., DAEMEN L.L., ZHAO Y., ZHA C.S., DOWNS R.T., WANG X., WANG Z.L., Nat. Mater., 4 (2005), 922.10.1038/nmat152216284620Search in Google Scholar

[5] FALCONY C., J. Appl. Phys., 72(4) (1992), 1525.10.1063/1.351720Search in Google Scholar

[6] BHISE M.D., KATIYAR M., KITAI A.H., J. Appl. Phys., 67 (1990), 1492.10.1063/1.345657Search in Google Scholar

[7] ORTIZ A., GARCIA M., SANCHEZ A., FALCONY C., J. Electrochem. Soc., 136 (1989), 1232.10.1149/1.2096860Search in Google Scholar

[8] FALCONY C., ORTIZ A., DOMINGUEZ J.M., FARIAS M.H., COTA-ARAIZA L., SOTO G., J. Electrochem. Soc., 139 (1992), 273.10.1149/1.2069182Search in Google Scholar

[9] ROBBINS D.J., DIMARIA D.J., FALCONY C., DONG D.W., J. Appl. Phys., 54 (1983), 4553.10.1063/1.332656Search in Google Scholar

[10] TANNAS L.E., Flat Panel Displays and CRTs, Van Nostrand, Reinhold, New York, 1985.10.1007/978-94-011-7062-8Search in Google Scholar

[11] HOA T.T.Q., THE N.D., MC VITIE S., NAM N.H., VU L.V., CANH T.D., LONG N.N., Opt. Mater., 33 (2011), 308.10.1016/j.optmat.2010.09.008Search in Google Scholar

[12] TOMOMURA Y., KITAGAWA M., SUZUKI A., NAKAJIMA S., J. Cryst. Growth, 99 (1990), 451.10.1016/0022-0248(90)90562-YSearch in Google Scholar

[13] TONOUCHI M., SUN Y., MIYASATO T., SAKAMA H., OHMURA M., Jpn. J. Appl. Phys., 29 (1990), 2453.10.1143/JJAP.29.L2453Search in Google Scholar

[14] DEAN P.J., PITT A.D., SKOLNICK M.S., WRIGHT P.J., COCKAYNE B., J. Cryst. Growth, 59 (1982), 301.10.1016/0022-0248(82)90341-4Search in Google Scholar

[15] PORADA Z., SCHABOWSKA-OSIOWSKA E., Thin Solid Films, 145 (1986), 75.10.1016/0040-6090(86)90253-1Search in Google Scholar

[16] LUO P.F., JIANG G., ZHU C., Chinese J. Chem. Phys., 22 (2009), 97.10.1088/1674-0068/22/01/97-101Search in Google Scholar

[17] JONES G., WOODS J., J. Lumin., 9 (1974), 389.10.1016/0022-2313(74)90032-5Search in Google Scholar

[18] SASAKURA H., KOBAYASHI H., TANAKA S., MITA J., TANAKA T., NAKAYAMA H., J. Appl. Phys., 52 (1981), 6901.10.1063/1.328642Search in Google Scholar

[19] AFIFI H.H., MAHMOUD S.A., ASHOUR A., Thin Solid Films, 263 (1995), 248.10.1016/0040-6090(95)06565-2Search in Google Scholar

[20] ZAWARE R.V., WAGH B.G., Mater. Sci.-Poland, 32 (3) (2014), 375.10.2478/s13536-014-0224-ySearch in Google Scholar

[21] ZAWARE R.V., WAGH B.G., Arab. J. Sci. Eng., 40 (7) (2015), 2049.10.1007/s13369-014-1533-5Search in Google Scholar

[22] PEACOCK J.C., PEACOCK B.L.DEG., J. Pharm. Sci.- US, 7 (1918), 689.10.1002/jps.3080070807Search in Google Scholar

[23] LOPEZ M.C., ESPINOS J.P., MARTIN F., LEINEN D., RAMOS-BARRADO J.S., J. Cryst. Growth, 285 (2005), 66.10.1016/j.jcrysgro.2005.07.050Search in Google Scholar

[24] BOUBAKER K., CHAOUACHI A., AMLOUK M., BOUZOUITA H., Eur. Phys. J. Appl. Phys., 37 (2007), 105.10.1051/epjap:2007005Search in Google Scholar

[25] CULLITY B.D., STOCK S.R., Elements of X-ray diffraction, Prentice Hall, India, 2001.Search in Google Scholar

[26] MURALI K.R., KUMARESAN S., Chalcogenide Lett., 6 (2009), 17.Search in Google Scholar

[27] VELUMANI S., MATHEW X., SEBASTIAN P.J., Sol. Energ. Mat. Sol. C., 76 (2003), 359.Search in Google Scholar

[28] ILICAN S., CAGLAR Y., CAGLAR M., J. Optoelectron. Adv. M., 10 (2008), 2578.Search in Google Scholar

[29] SHINDE M.S., AHIRRAO P.B., PATIL R.S., Arch. Appl. Sci. Res., 3 (2011), 311.Search in Google Scholar

[30] GOSWAMI A., Thin Film Fundamentals, New Age International Ltd., India, 2008.Search in Google Scholar

[31] JOHNSTON D.A., CARLETTO M.H., REDDY K.T.R., FORBES I., MILES R.W., Thin Solid Films, 403 (2002), 102.10.1016/S0040-6090(01)01536-XSearch in Google Scholar

[32] LUO P.F., JIANG G., ZHU C., Chinese J. Chem. Phys., 22 (2009), 97.10.1088/1674-0068/22/01/97-101Search in Google Scholar

[33] LI Z.Q., SHI J.H., LIU Q.Q., WANG Z.A., SUN Z., HUANG S.M., Appl. Surf. Sci., 257 (2010), 12210.1016/j.apsusc.2010.06.047Search in Google Scholar

[34] RAVIPRAKASH Y., BANGERA K.V., SHIVKUMAR G.K., Sol. Energy, 83 (2009), 1645.10.1016/j.solener.2009.06.004Search in Google Scholar

[35] FALCONY C., GARCIA M., ORTIZ A., ALONSO J.C., J. Appl. Phys., 72 (1992), 1525.10.1063/1.351720Search in Google Scholar

[36] COTTRELL A., An Introduction to Metallurgy, University Press, Hyderabad, India, 2000.Search in Google Scholar

[37] BOUROUSHIAN M., LOIZOS Z., SPYRELLIS N., MOURIN G., Appl. Surf. Sci., 115 (1997), 103.10.1016/S0169-4332(97)80191-2Search in Google Scholar

[38] BISWAS S., KAR S., Nanotechnology, 19 (2008), 45710.10.1088/0957-4484/19/04/045710Search in Google Scholar

[39] SAPRA S., NANDA J., ANAND A., BHAT S.V., SARMA D.D., J. Nanosci. Nanotechno., 3 (2003), 392.10.1166/jnn.2003.211Search in Google Scholar

[40] TAYLOR G.I., P. Roy. Soc. A-Math. Phy., 145 (1934), 362.Search in Google Scholar

[41] XUANZHI W., Sol. Energy, 77 (2004), 803.10.1097/01.TP.0000115649.87806.7BSearch in Google Scholar

[42] JIANFENY C., YALING L., YUHONG W., JIMMY Y., DAPENG C., Mater. Res. Bull., 39 (2004), 185.Search in Google Scholar

[43] GENG B.Y., LIU X.W., DU Q.B., WEI X.W., ZHANG L.D., Appl. Phys. Lett., 88 (2006), 163104.10.1063/1.2196827Search in Google Scholar

[44] LEVY L., HOCHEPIED J.F., PILENI M.P., J. Phys. Chem., 100 (1996), 18322.10.1021/jp960824wSearch in Google Scholar

[45] MOTE V.D., PURUSHOTHAM Y., DOLE B.N., Ceramica, 59 (2013), 614.10.1590/S0366-69132013000400019Search in Google Scholar

[46] BRIELER F.J., FROBA M., CHEM L., KLAR P.J., HEIMBRODT W., KRUG H.A., NIDDA V., LOIDL A., Chem. Eur. J., 81 (2002), 185.10.1002/1521-3765(20020104)8:1<185::AID-CHEM185>3.0.CO;2-LSearch in Google Scholar

[47] DRIGGERS R.G. (Ed.), Encyclopedia of Optical Engineering, Vol. 3, CRC Press, India, 2003.Search in Google Scholar

[48] MENDOZA-GALVAN A., TREJO-CRUZ C., LEE J., BHATTACHARYYA D., METSON J.B., EVANS P.J., PAL U., J. Appl. Phys., 99 (2006), 1.10.1063/1.2158503Search in Google Scholar

[49] KAR S., CHAUDHURI S., J. Phys. Chem. B, 109 (2005), 3298.10.1021/jp045817jSearch in Google Scholar

[50] ODA S., KUKIMOTO H., J. Lumin., 18 - 19 (1979), 829.10.1016/0022-2313(79)90245-XSearch in Google Scholar

[51] SAMELSON H., LEMPICKI A., Phys. Review, 125 (1962), 901.10.1103/PhysRev.125.901Search in Google Scholar

[52] BHARGAVA R.N., GALLAGHER D., HONG X., NURMIKKO A., Phys. Rev. Lett., 72 (1994), 311.10.1103/PhysRevLett.72.41610056425Search in Google Scholar

[53] LU H.Y., CHU S.Y., TAN S.S., Jpn. J. Appl. Phys., 44 (7A) (2005), 5282.10.1143/JJAP.44.5282Search in Google Scholar

[54] WARREN A.J., THOMAS C.B., STEWENS P.R.C., J. Phys. D Appl. Phys., 16 (1983), 225.10.1088/0022-3727/16/2/020Search in Google Scholar

[55] SUYVER J.F., WUISTER S.F., KELLY J.J., MEIJERINK A., Nano Lett., 1 (2001), 429.10.1021/nl015551hSearch in Google Scholar

eISSN:
2083-134X
Lingua:
Inglese
Frequenza di pubblicazione:
4 volte all'anno
Argomenti della rivista:
Materials Sciences, other, Nanomaterials, Functional and Smart Materials, Materials Characterization and Properties