INFORMAZIONI SU QUESTO ARTICOLO

Cita

Pavel Kulha
Department of Microelectronics, Faculty of Electrical Engineering, Czech Technical University in Prague, Technická 2, 166 27 Prague, Czech Republic
Institute of Physics, Czech Academy of Sciences, Cukrovarnická 10, 162 00 Prague, Czech Republic
Jiří Kroutil
Department of Microelectronics, Faculty of Electrical Engineering, Czech Technical University in Prague, Technická 2, 166 27 Prague, Czech Republic
Alexandr Laposa
Department of Microelectronics, Faculty of Electrical Engineering, Czech Technical University in Prague, Technická 2, 166 27 Prague, Czech Republic
Václav Procházka
Department of Microelectronics, Faculty of Electrical Engineering, Czech Technical University in Prague, Technická 2, 166 27 Prague, Czech Republic
Institute of Physics, Czech Academy of Sciences, Cukrovarnická 10, 162 00 Prague, Czech Republic
Miroslav Husák
Department of Microelectronics, Faculty of Electrical Engineering, Czech Technical University in Prague, Technická 2, 166 27 Prague, Czech Republic
eISSN:
1339-309X
Lingua:
Inglese
Frequenza di pubblicazione:
6 volte all'anno
Argomenti della rivista:
Engineering, Introductions and Overviews, other