<abstract xml:lang="en" xmlns="http://www.w3.org/1999/xhtml"><p>The influence of the particle size on the surface sensitivity in XPS analysis was investigated. Previous reports about such influence were qualitatively only. In this report there are given mathematical description of XPS sensitivity and quantitative results. It was found that influence due to nanometric size on XPS analysis can be noticeable for particles below 15 nm of diameter and increases dramatically with reduction of the size.</p></abstract>

The influence of the particle size on the surface sensitivity in XPS analysis was investigated. Previous reports about such influence were qualitatively only. In this report there are given mathematical description of XPS sensitivity and quantitative results. It was found that influence due to nanometric size on XPS analysis can be noticeable for particles below 15 nm of diameter and increases dramatically with reduction of the size.

Enhancement of XPS surface sensitivity in nanocrystalline material

Institute of Chemical and Environment Engineering, West Pomeranian University of Technology, ul. Pulaskiego 10, 70-322 Szczecin, Poland

Polish Journal of Chemical Technology

{"article-title":"Enhancement of XPS surface sensitivity in nanocrystalline material"}

The influence of the particle size on the surface sensitivity in XPS analysis was investigated. Previous reports about such influence were qualitatively only....

Enhancement of XPS surface sensitivity in nanocrystalline material

Publié en ligne: 28 déc. 2010

Pages: 62 - 63

DOI: https://doi.org/10.2478/v10026-010-0052-8

Mots clés
XPS, nanomaterials, surface science

This content is open access.

Enhancement of XPS surface sensitivity in nanocrystalline material

Publié en ligne: 28 déc. 2010

Pages: 62 - 63

DOI: https://doi.org/10.2478/v10026-010-0052-8

Mots clésXPS, nanomaterials, surface science

This content is open access.

Mots clés
XPS, nanomaterials, surface science