Method of determination of palladium concentration for C-Pd nanostructural films as a function of film thickness, roughness and topography

Publié en ligne: 22 juil. 2014

Pages: 228 - 235

DOI: https://doi.org/10.2478/s13536-013-0194-5

Mots clés

palladium, carbon, SEM, EDX

© 2014 Wroclaw University of Technology

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.