<abstract xml:lang="en" xmlns="http://www.w3.org/1999/xhtml"><p>Nondoped BiFeO3 (BFO) and doped Bi0.9La0.1Fe0.9Mn0.1O3 (BLFMO) thin films (d = 200–350 nm) were grown at 650–750 °C by RF sputtering on Si and SrTiO3(100), coated by conductive LaNiO3 films and La2/3Ca1/3MnO3/SrRuO3 bilayers. The complex dielectric permittivity of the films was measured at room temperature in the frequency range from 10 MHz to 10 GHz using parallel plate capacitor structures. Dielectric properties of the polycrystalline BFO films were compared with those of the epitaxial quality BLFMO films, and it was seen that the latter has better microwave performance than the former. The dielectric losses were below 0.05 at 1 GHz frequency, which may be acceptable for microwave applications.</p></abstract>

Nondoped BiFeO3 (BFO) and doped Bi0.9La0.1Fe0.9Mn0.1O3 (BLFMO) thin films (d = 200–350 nm) were grown at 650–750 °C by RF sputtering on Si and SrTiO3(100), coated by conductive LaNiO3 films and La2/3Ca1/3MnO3/SrRuO3 bilayers. The complex dielectric permittivity of the films was measured at room temperature in the frequency range from 10 MHz to 10 GHz using parallel plate capacitor structures. Dielectric properties of the polycrystalline BFO films were compared with those of the epitaxial quality BLFMO films, and it was seen that the latter has better microwave performance than the former. The dielectric losses were below 0.05 at 1 GHz frequency, which may be acceptable for microwave applications.

Microwave dielectric properties of BiFeO3 multiferoic films deposited on conductive layers

Faculty of Physics, Vilnius University, Saulètekio 9, Vilnius, Lithuania

Semiconductor Physics Institute, Goštauto 14, Vilnius, Lithuania

Materials Science-Poland

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

Nondoped BiFeO3 (BFO) and doped Bi0.9La0.1Fe0.9Mn0.1O3 (BLFMO) thin films (d = 200–350 nm) were grown at 650–750 °C by RF sputtering on Si and SrTiO3(100),...

Microwave dielectric properties of BiFeO3 multiferoic films deposited on conductive layers

Publié en ligne: 03 août 2011

Pages: 41 - 46

DOI: https://doi.org/10.2478/s13536-011-0008-6

Mots clés
multiferroic, bismuth ferrite, RF sputtering, dielectric permittivity, dielectric loss

© 2011 Wroclaw University of Technology

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

Microwave dielectric properties of BiFeO3 multiferoic films deposited on conductive layers

Publié en ligne: 03 août 2011

Pages: 41 - 46

DOI: https://doi.org/10.2478/s13536-011-0008-6

Mots clésmultiferroic, bismuth ferrite, RF sputtering, dielectric permittivity, dielectric loss

© 2011 Wroclaw University of Technology

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

Mots clés
multiferroic, bismuth ferrite, RF sputtering, dielectric permittivity, dielectric loss