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A Distance Metric for Modeling the Quality of Administrative Records for Use in the 2020 U.S. Census

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Journal of Official Statistics
Special Section on Responsive and Adaptive Survey Design
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Andrew Keller
Washington, DC
Vincent T. Mule
Washington, DC
Darcy Steeg Morris
Washington, DC
Scott Konicki
Washington, DC
eISSN:
2001-7367
Langue:
Anglais
Périodicité:
4 fois par an
Sujets de la revue:
Mathematics, Probability and Statistics