<abstract xmlns="http://www.w3.org/1999/xhtml"><p> In this paper we present the utilization of capacitance and current-voltage diagnostic techniques to analyse silicon heterojunction solar cell structures properties, particularly focused on the inspection of the amorphous emitter and amorphous silicon/crystalline silicon hetero-interface. The capacitance characterization of investigated samples have revealed the need for improvement of the a-Si:H/c-Si heterointerface quality as a main direction to obtain superior output performance of heterojunction cells. In addition, current-voltage characterization emphasized importance for enhancement of the light management in the structure. The obtained results demonstrate that electrical and capacitance diagnostic techniques can represents important diagnostic tools in the process of optimization of solar cells.</p></abstract>

In this paper we present the utilization of capacitance and current-voltage diagnostic techniques to analyse silicon heterojunction solar cell structures properties, particularly focused on the inspection of the amorphous emitter and amorphous silicon/crystalline silicon hetero-interface. The capacitance characterization of investigated samples have revealed the need for improvement of the a-Si:H/c-Si heterointerface quality as a main direction to obtain superior output performance of heterojunction cells. In addition, current-voltage characterization emphasized importance for enhancement of the light management in the structure. The obtained results demonstrate that electrical and capacitance diagnostic techniques can represents important diagnostic tools in the process of optimization of solar cells.

Electrical and Capacitance Diagnostic Techniques as a Support for the Development of Silicon Heterojunction Solar Cells

Institute of Electronics and Photonics, Faculty of Electrical Engineering and Information technology, Slovak University of Technology, Ilkovičova 3, 812 19 Bratislava, Slovakia

Journal of Electrical Engineering

This article is distributed under the terms of the Creative Commons Attribution Non-Commercial License, which permits unrestricted non-commercial use, distribution, and reproduction in any medium, provided the original work is properly cited.

In this paper we present the utilization of capacitance and current-voltage diagnostic techniques to analyse silicon heterojunction solar cell structures...

Electrical and Capacitance Diagnostic Techniques as a Support for the Development of Silicon Heterojunction Solar Cells

Publié en ligne: 23 avr. 2014

Pages: 111 - 115

DOI: https://doi.org/10.2478/jee-2014-0016

Mots clés
solar cells, heterojunction, amorphous silicon, capacitance diagnostics, electrical characterization

© Faculty of Electrical Engineering and Information Technology, Slovak University of Technology

This article is distributed under the terms of the Creative Commons Attribution Non-Commercial License, which permits unrestricted non-commercial use, distribution, and reproduction in any medium, provided the original work is properly cited.

Electrical and Capacitance Diagnostic Techniques as a Support for the Development of Silicon Heterojunction Solar Cells

Publié en ligne: 23 avr. 2014

Pages: 111 - 115

DOI: https://doi.org/10.2478/jee-2014-0016

Mots cléssolar cells, heterojunction, amorphous silicon, capacitance diagnostics, electrical characterization

© Faculty of Electrical Engineering and Information Technology, Slovak University of Technology

This article is distributed under the terms of the Creative Commons Attribution Non-Commercial License, which permits unrestricted non-commercial use, distribution, and reproduction in any medium, provided the original work is properly cited.

Mots clés
solar cells, heterojunction, amorphous silicon, capacitance diagnostics, electrical characterization