<abstract xmlns="http://www.w3.org/1999/xhtml">

<p>Diffraction techniques and methods with X-rays and less diffraction of electrons, neutrons, etc. are frequently used to investigate the fine structure. X-ray techniques have the advantage that they are cheaper and provide statistical information at the level of fine ordered structure and are not significantly disturbed by the magnetic state of the substance. But the experimental reality complicates matters. The geometric divergence (vertical and horizontal) of the incident beam, the deviation from the ideal monochromatism and the diffraction geometry induce certain corrections for the expression of the integral diffraction intensity. This article addresses the calculation of the integral diffraction intensity affected by these factors for certain methods of X-ray structural analysis.</p>
</abstract>

Diffraction techniques and methods with X-rays and less diffraction of electrons, neutrons, etc. are frequently used to investigate the fine structure. X-ray techniques have the advantage that they are cheaper and provide statistical information at the level of fine ordered structure and are not significantly disturbed by the magnetic state of the substance. But the experimental reality complicates matters. The geometric divergence (vertical and horizontal) of the incident beam, the deviation from the ideal monochromatism and the diffraction geometry induce certain corrections for the expression of the integral diffraction intensity. This article addresses the calculation of the integral diffraction intensity affected by these factors for certain methods of X-ray structural analysis.

Correction of the Expression of the Integral Diffraction Intensity for Certain Types of X-Ray Structural Analysis Methods

Faculty of Materials Engineering and Mechanics

Scientific Bulletin of Valahia University - Materials and Mechanics

This work is licensed under the Creative Commons Attribution 4.0 International License.

Diffraction techniques and methods with X-rays and less diffraction of electrons, neutrons, etc. are frequently used to investigate the fine structure. X-ray...

Correction of the Expression of the Integral Diffraction Intensity for Certain Types of X-Ray Structural Analysis Methods

Publié en ligne: 30 avr. 2022

Pages: 21 - 25

DOI: https://doi.org/10.2478/bsmm-2022-0003

Mots clés
X-rays, diffraction geometry, divergence parameters, Lorentz factor

© 2022 Florina Violeta Anghelina et al., published by Sciendo

This work is licensed under the Creative Commons Attribution 4.0 International License.

Correction of the Expression of the Integral Diffraction Intensity for Certain Types of X-Ray Structural Analysis Methods

Publié en ligne: 30 avr. 2022

Pages: 21 - 25

DOI: https://doi.org/10.2478/bsmm-2022-0003

Mots clésX-rays, diffraction geometry, divergence parameters, Lorentz factor

© 2022 Florina Violeta Anghelina et al., published by Sciendo

This work is licensed under the Creative Commons Attribution 4.0 International License.

Mots clés
X-rays, diffraction geometry, divergence parameters, Lorentz factor