The detection of reverse accumulation effect in the positron annihilation profile of stack of aluminum and silver foils

The implantation profile of positrons emitted from ²²Na into a stack of aluminum and silver foils is the subject of the presented report. The characteristic dimple in the profile behind the Ag foil was detected. This effect arises from the differences in the linear absorption coefficient of aluminum and silver. The good agreement between the theoretical profile obtained within the multiscattering model and experimental one was achieved. The observed phenomenon can affect the positron annihilation characteristics measured for the inhomogeneous samples.