Operation modes of the FALCON ion source as a part of the AMS cluster tool
, , , et
22 juin 2015
À propos de cet article
Publié en ligne: 22 juin 2015
Pages: 327 - 330
Reçu: 19 mai 2014
Accepté: 05 mai 2015
DOI: https://doi.org/10.1515/nuka-2015-0059
Mots clés
© Oleksii Girka et al.
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.
The paper investigates the options to increase the production yield of temperature compensated surface acoustic wave (SAW) devices with a defined range of operational frequencies. The paper focuses on the preparation of large wafers with SiO2 and AlN/Si3N4 depositions. Stability of the intermediate SiO2 layer is achieved by combining high power density UV radiation with annealing in high humidity environment. A uniform thickness of the capping AlN layer is achieved by local high-rate etching with a focused ion beam emitted by the FALCON ion source. Operation parameters and limitations of the etching process are discussed.