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A Novel Dynamic Method to Improve First-order Natural Frequency for Test Device

Jun Zhang

Jun Zhang

Faculty of Mechanical engineering, Dalian University of Technology,Dalian, China
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Zhang, Jun
, 
Yu Tian

Yu Tian

Faculty of Mechanical engineering, Dalian University of Technology,Dalian, China
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Tian, Yu
, 
Zongjin Ren

Zongjin Ren

Faculty of Mechanical engineering, Dalian University of Technology,Dalian, China
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Ren, Zongjin
, 
Jun Shao

Jun Shao

Faculty of Mechanical engineering, Dalian University of Technology,Dalian, China
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Shao, Jun
 et 
Zhenyuan Jia

Zhenyuan Jia

Faculty of Mechanical engineering, Dalian University of Technology,Dalian, China
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Jia, Zhenyuan
  
17 oct. 2018
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Publié en ligne: 17 oct. 2018
Pages: 183 - 192
Reçu: 20 févr. 2018
Accepté: 10 sept. 2018
DOI: https://doi.org/10.1515/msr-2018-0026
Mots clés
© 2018 Jun Zhang, published by Sciendo
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.
Zhang, Jun
Faculty of Mechanical engineering, Dalian University of Technology,Dalian, China
Tian, Yu
Faculty of Mechanical engineering, Dalian University of Technology,Dalian, China
Ren, Zongjin
Faculty of Mechanical engineering, Dalian University of Technology,Dalian, China
Shao, Jun
Faculty of Mechanical engineering, Dalian University of Technology,Dalian, China
Jia, Zhenyuan
Faculty of Mechanical engineering, Dalian University of Technology,Dalian, China
Langue:
Anglais
Périodicité:
6 fois par an
Sujets de la revue:
Ingénierie, Ingénierie électrique, Ingénierie de contrôle, métrologie et essais
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