<abstract xmlns="http://www.w3.org/1999/xhtml"> The voltage and frequency dependence of dielectric constant є′, dielectric loss є″, electrical modulus M″, M′, loss tangent tanδ and AC electrical conductivity σAC of p-Si/ZnO/PMMA/Al, p-Si/ZnO/Al and p-Si/PMMA/Al structures have been investigated by means of experimental G-V and C-V measurements at 30 kHz, 100kHz, 500 kHz and 1 MHz in this work. While the values of є′, є″, tanδ and σAC decreased, the values of M′ and M″ increased for these structures when frequency was increased and those of p-Si/ZnO/Al and p-Si/PMMA/Al were comparable with those of p-Si/ZnO/PMMA/Al. The obtained results showed that the values of p-Si/ZnO/PMMA/Al structure were lower than the values of p-Si/ZnO/Al and p-Si/PMMA/Al. </abstract>

The voltage and frequency dependence of dielectric constant є′, dielectric loss є″, electrical modulus M″, M′, loss tangent tanδ and AC electrical conductivity σAC of p-Si/ZnO/PMMA/Al, p-Si/ZnO/Al and p-Si/PMMA/Al structures have been investigated by means of experimental G-V and C-V measurements at 30 kHz, 100kHz, 500 kHz and 1 MHz in this work. While the values of є′, є″, tanδ and σAC decreased, the values of M′ and M″ increased for these structures when frequency was increased and those of p-Si/ZnO/Al and p-Si/PMMA/Al were comparable with those of p-Si/ZnO/PMMA/Al. The obtained results showed that the values of p-Si/ZnO/PMMA/Al structure were lower than the values of p-Si/ZnO/Al and p-Si/PMMA/Al.

Investigation of dielectric properties of heterostructures based on ZnO structures

Materials Science-Poland

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

The voltage and frequency dependence of dielectric constant є′, dielectric loss є″, electrical modulus M″, M′, loss tangent tanδ and AC electrical conductivity...

Investigation of dielectric properties of heterostructures based on ZnO structures

Publié en ligne: 20 mars 2018

Pages: 885 - 892

Reçu: 26 juil. 2017

Accepté: 07 déc. 2017

DOI: https://doi.org/10.1515/msp-2017-0108

Mots clés
electric modulus, organic thin film, dielectric loss, heterostructure, electrical conductivity

© 2018

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

Investigation of dielectric properties of heterostructures based on ZnO structures

Publié en ligne: 20 mars 2018

Pages: 885 - 892

Reçu: 26 juil. 2017

Accepté: 07 déc. 2017

DOI: https://doi.org/10.1515/msp-2017-0108

Mots cléselectric modulus, organic thin film, dielectric loss, heterostructure, electrical conductivity

© 2018

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

Mots clés
electric modulus, organic thin film, dielectric loss, heterostructure, electrical conductivity