<abstract xmlns="http://www.w3.org/1999/xhtml"><p>In this paper we present the results of investigation of micro- and nanoscale degradation of a sheet moulded composite exposed to simulated solar radiation. Utilization of high resolution methods such as atomic force microscopy, optical profilometry and microcomputer tomography allowed us to provide the evidence of significant deterioration of the surface as well as the material few microns in depth. Additionally, the typically used macroscopic investigations, such as wettability and flexural strength, were performed to observe the impact of weathering process. It was also shown that high resolution techniques provide superior sensitivity of the material degradation detection. The particular effectiveness of the applied approach was related to the structure of investigated material, as due to its degradation, a number of voids appeared, causing a significant roughness increase. In addition, the impact of light radiation could be compared to other environmental conditions maintained in the climatic chamber. It should be underlined, that according to our knowledge, such a study has not been performed so far.</p></abstract>

In this paper we present the results of investigation of micro- and nanoscale degradation of a sheet moulded composite exposed to simulated solar radiation. Utilization of high resolution methods such as atomic force microscopy, optical profilometry and microcomputer tomography allowed us to provide the evidence of significant deterioration of the surface as well as the material few microns in depth. Additionally, the typically used macroscopic investigations, such as wettability and flexural strength, were performed to observe the impact of weathering process. It was also shown that high resolution techniques provide superior sensitivity of the material degradation detection. The particular effectiveness of the applied approach was related to the structure of investigated material, as due to its degradation, a number of voids appeared, causing a significant roughness increase. In addition, the impact of light radiation could be compared to other environmental conditions maintained in the climatic chamber. It should be underlined, that according to our knowledge, such a study has not been performed so far.

Investigation of the impact of simulated solar radiation on the micro- and nanoscale morphology and mechanical properties of a sheet moulded composite surface

Materials Science-Poland

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.

In this paper we present the results of investigation of micro- and nanoscale degradation of a sheet moulded composite exposed to simulated solar radiation....

Investigation of the impact of simulated solar radiation on the micro- and nanoscale morphology and mechanical properties of a sheet moulded composite surface

Article Category: Research Article

Publié en ligne: 28 sept. 2016

Pages: 641 - 649

Reçu: 18 janv. 2016

Accepté: 28 juin 2016

DOI: https://doi.org/10.1515/msp-2016-0080

Mots clés
weathering, material decomposition, sheet moulded composite, atomic force microscopy, microcomputer tomography

© 2016 Andrzej Sikora et al., published by Sciendo

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.

Investigation of the impact of simulated solar radiation on the micro- and nanoscale morphology and mechanical properties of a sheet moulded composite surface

Article Category: Research Article

Publié en ligne: 28 sept. 2016

Pages: 641 - 649

Reçu: 18 janv. 2016

Accepté: 28 juin 2016

DOI: https://doi.org/10.1515/msp-2016-0080

Mots clésweathering, material decomposition, sheet moulded composite, atomic force microscopy, microcomputer tomography

© 2016 Andrzej Sikora et al., published by Sciendo

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.

Mots clés
weathering, material decomposition, sheet moulded composite, atomic force microscopy, microcomputer tomography