<abstract xmlns="http://www.w3.org/1999/xhtml"><p>Suppression of spectral reflectance from the surface of solar cell is necessary for achieving a high energy conversion efficiency. We developed a simple method for forming nanocrystalline layers with ultralow reflectance in a broad range of wavelengths. The method is based on metal assisted etching of the silicon surface. In this work, we prepared Si solar cell structures with embedded nanocrystalline layers. The microstructure of embedded layer depends on the etching conditions. We examined the microstructure of the etched layers by a transmission electron microscope and analysed the experimental images by statistical and Fourier methods. The obtained results provide information on the applied treatment operations and can be used to optimize the solar cell forming procedure.</p></abstract>

Suppression of spectral reflectance from the surface of solar cell is necessary for achieving a high energy conversion efficiency. We developed a simple method for forming nanocrystalline layers with ultralow reflectance in a broad range of wavelengths. The method is based on metal assisted etching of the silicon surface. In this work, we prepared Si solar cell structures with embedded nanocrystalline layers. The microstructure of embedded layer depends on the etching conditions. We examined the microstructure of the etched layers by a transmission electron microscope and analysed the experimental images by statistical and Fourier methods. The obtained results provide information on the applied treatment operations and can be used to optimize the solar cell forming procedure.

Properties of nanocrystalline Si layers embedded in structure of solar cell

Institute of Scientific and Industrial Research

Journal of Electrical Engineering

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

{"article-title":"Properties of nanocrystalline Si layers embedded in structure of solar cell"}

Suppression of spectral reflectance from the surface of solar cell is necessary for achieving a high energy conversion efficiency. We developed a simple method...

Properties of nanocrystalline Si layers embedded in structure of solar cell

Publié en ligne: 29 déc. 2017

Pages: 48 - 52

Reçu: 23 avr. 2017

DOI: https://doi.org/10.1515/jee-2017-0055

Mots clés
semiconductor, silicon solar cell, microstructure, Fourier analysis

© 2017 Stanislav Jurečka et al., published by De Gruyter Open

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

Properties of nanocrystalline Si layers embedded in structure of solar cell

Publié en ligne: 29 déc. 2017

Pages: 48 - 52

Reçu: 23 avr. 2017

DOI: https://doi.org/10.1515/jee-2017-0055

Mots cléssemiconductor, silicon solar cell, microstructure, Fourier analysis

© 2017 Stanislav Jurečka et al., published by De Gruyter Open

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

Mots clés
semiconductor, silicon solar cell, microstructure, Fourier analysis