<abstract xml:lang="en" xmlns="http://www.w3.org/1999/xhtml"><p>The paper discusses the possibilities of acquiring and processing the dielectric data in the range of very low frequency (VLF) and also design and construction of an impedance analyzer for measurements in this frequency range. The impedance measurements in the VLF range were used for investigation of the influence of radiation on the cross-linked polyethylene cable dielectric. An expressive β-type relaxation process was found in this type of cable. Most of the dielectric response parameters of the process depend significantly on the absorbed dose of radiation. The analysis of the process parameters showed that the most probable reason of the structural changes in cross-linked polyethylene was additional cross-linking. The results also proved that the impedance measurements in the VLF range could be effectively used in practice for estimation of the absorbed dose in the cross-linked polyethylene cables stressed by radiation.t data only. In order to identify or classify motion, data processing in real time is needed.</p></abstract>

The paper discusses the possibilities of acquiring and processing the dielectric data in the range of very low frequency (VLF) and also design and construction of an impedance analyzer for measurements in this frequency range. The impedance measurements in the VLF range were used for investigation of the influence of radiation on the cross-linked polyethylene cable dielectric. An expressive β-type relaxation process was found in this type of cable. Most of the dielectric response parameters of the process depend significantly on the absorbed dose of radiation. The analysis of the process parameters showed that the most probable reason of the structural changes in cross-linked polyethylene was additional cross-linking. The results also proved that the impedance measurements in the VLF range could be effectively used in practice for estimation of the absorbed dose in the cross-linked polyethylene cables stressed by radiation.t data only. In order to identify or classify motion, data processing in real time is needed.

Influence of Radiation on the Dielectric Properties of XLPE Based Insulation Systems

Faculty of Electrical Engineering and Information Technology, Department of Electrotechnology, Slovak University of Technology in Bratislava, Ilkovičova 3, 812 19 Bratislava

Journal of Electrical Engineering

The paper discusses the possibilities of acquiring and processing the dielectric data in the range of very low frequency (VLF) and also design and construction...

Influence of Radiation on the Dielectric Properties of XLPE Based Insulation Systems

Publicado en línea: 07 jun 2011

Páginas: 229 - 234

DOI: https://doi.org/10.2478/v10187-010-0032-5

Palabras clave
cable diagnostics, dielectric spectroscopy, very low frequency, relaxation

This content is open access.

Influence of Radiation on the Dielectric Properties of XLPE Based Insulation Systems

Publicado en línea: 07 jun 2011

Páginas: 229 - 234

DOI: https://doi.org/10.2478/v10187-010-0032-5

Palabras clavecable diagnostics, dielectric spectroscopy, very low frequency, relaxation

This content is open access.

Palabras clave
cable diagnostics, dielectric spectroscopy, very low frequency, relaxation