<abstract xml:lang="en" xmlns="http://www.w3.org/1999/xhtml"><p>The paper deals with determination of an optimum frequency for the time domain and frequency domain ADC testing. Proposed algorithm for selection of test signal frequency fulfills two common requirements. The first requirement is to get maximum quantity of distinct phases of the sampled values which are uniformly distributed between 0 and 2π; the second one is to avoid overlapping of higher harmonic components aliased in the first Nyquist zone. The algorithm was verified using MATLAB simulations and practical measurements.</p></abstract>

The paper deals with determination of an optimum frequency for the time domain and frequency domain ADC testing. Proposed algorithm for selection of test signal frequency fulfills two common requirements. The first requirement is to get maximum quantity of distinct phases of the sampled values which are uniformly distributed between 0 and 2π; the second one is to avoid overlapping of higher harmonic components aliased in the first Nyquist zone. The algorithm was verified using MATLAB simulations and practical measurements.

Frequency Selection of Sine Wave for Dynamic ADC Test

Faculty of Electrical Engineering, Czech Technical University in Prague, Technická 2, CZ-16627 Prague 6, Czech Republic

Measurement Science Review

{"article-title":"Frequency Selection of Sine Wave for Dynamic ADC Test"}

The paper deals with determination of an optimum frequency for the time domain and frequency domain ADC testing. Proposed algorithm for selection of test...

Frequency Selection of Sine Wave for Dynamic ADC Test

Publicado en línea: 20 ene 2011

Páginas: 205 - 208

DOI: https://doi.org/10.2478/v10048-010-0035-1

Palabras clave
ADC testing, sine wave testing, frequency selection, windowed DFT, aliasing

This content is open access.

Frequency Selection of Sine Wave for Dynamic ADC Test

Publicado en línea: 20 ene 2011

Páginas: 205 - 208

DOI: https://doi.org/10.2478/v10048-010-0035-1

Palabras claveADC testing, sine wave testing, frequency selection, windowed DFT, aliasing

This content is open access.

Palabras clave
ADC testing, sine wave testing, frequency selection, windowed DFT, aliasing