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Iuliia Lysenko
Department of Automation and Non-Destructive Testing Systems, Faculty of Instrumentation Engineering, National Technical University of Ukraine “Igor Sikorsky Kyiv Polytechnic Institute”Kyiv, Ukraine
Yurii Kuts
Department of Automation and Non-Destructive Testing Systems, Faculty of Instrumentation Engineering, National Technical University of Ukraine “Igor Sikorsky Kyiv Polytechnic Institute”Kyiv, Ukraine
Valentyn Petryk
Department of Automation and Non-Destructive Testing Systems, Faculty of Instrumentation Engineering, National Technical University of Ukraine “Igor Sikorsky Kyiv Polytechnic Institute”Kyiv, Ukraine
Volodymyr Malko
Department of Automation and Non-Destructive Testing Systems, Faculty of Instrumentation Engineering, National Technical University of Ukraine “Igor Sikorsky Kyiv Polytechnic Institute”Kyiv, Ukraine
Andrii Melnyk
Department of Automation and Non-Destructive Testing Systems, Faculty of Instrumentation Engineering, National Technical University of Ukraine “Igor Sikorsky Kyiv Polytechnic Institute”Kyiv, Ukraine