Cite

Liping Tian
School of network and communication engineering, Jinling Institute of TechnologyNanjing, China
Key Laboratory of of Transient Optics and Photonics, Key Laboratory of Ultra-fast Photoelectric Diagnostics Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences Xi’an, China
Lingbin Shen
School of network and communication engineering, Jinling Institute of TechnologyNanjing, China
Yanhua Xue
Key Laboratory of of Transient Optics and Photonics, Key Laboratory of Ultra-fast Photoelectric Diagnostics Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences Xi’an, China
Lin Chen
School of network and communication engineering, Jinling Institute of TechnologyNanjing, China
Lili Li
Key Laboratory of of Transient Optics and Photonics, Key Laboratory of Ultra-fast Photoelectric Diagnostics Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences Xi’an, China
Ping Chen
Key Laboratory of of Transient Optics and Photonics, Key Laboratory of Ultra-fast Photoelectric Diagnostics Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences Xi’an, China
Jinshou Tian
Key Laboratory of of Transient Optics and Photonics, Key Laboratory of Ultra-fast Photoelectric Diagnostics Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences Xi’an, China
Wei Zhao
Key Laboratory of of Transient Optics and Photonics, Key Laboratory of Ultra-fast Photoelectric Diagnostics Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences Xi’an, China
eISSN:
1335-8871
Idioma:
Inglés
Calendario de la edición:
6 veces al año
Temas de la revista:
Engineering, Electrical Engineering, Control Engineering, Metrology and Testing