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Non-classical Signature of Parametric Fluorescence and its Application in Metrology


Cite

M. Hamar
Institute of Physics of Academy of Sciences of the Czech Republic, Joint Laboratory of Optics of Palacky University
Institute of Physics of Academy of Sciences of the Czech Republic, 17. listopadu 12, 772 07 Olomouc, Czech Republic
V. Michálek
Institute of Physics of Academy of Sciences of the Czech Republic, Joint Laboratory of Optics of Palacky University
Institute of Physics of Academy of Sciences of the Czech Republic, 17. listopadu 12, 772 07 Olomouc, Czech Republic
A. Pathak
RCPTM, Joint Laboratory of Optics of Palacky University and Institute of Physics of the Academy of Sciences of the Czech Republic, tr. 17. listopadu 50a, Olomouc, 77207, Czech Republic
Department of Physics, Jaypee Institute of Information Technology , A-10, Sector-62, Noida, UP-201307, India
eISSN:
1335-8871
Idioma:
Inglés
Calendario de la edición:
6 veces al año
Temas de la revista:
Engineering, Electrical Engineering, Control Engineering, Metrology and Testing