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The microstructures of in-situ synthesized TiC by Ti-CNTs reaction in Cu melts

Xuexia Xu
Xuexia Xu
, 
Yong Wang
Yong Wang
, 
Qing Wang
Qing Wang
, 
Guozhen Dong
Guozhen Dong
, 
Wenbin Li
Wenbin Li
, 
Guowei Li
Guowei Li
, 
YaDong Lv
YaDong Lv
, 
Jin Zhang
Jin Zhang
 y 
Haimin Ding
Haimin Ding
   | 13 jul 2022
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Publicado en línea: 13 jul 2022
Páginas: 145 - 158
Recibido: 10 ene 2022
Aceptado: 19 may 2022
DOI: https://doi.org/10.2478/msp-2022-0018
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© 2022 Xuexia Xu et al., published by Sciendo
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.

Fig. 1

The microstructures of the used CNTs (a) Low magnification microstructure; (b) High magnification microstructure. CNTs, carbon nanotubes
The microstructures of the used CNTs (a) Low magnification microstructure; (b) High magnification microstructure. CNTs, carbon nanotubes

Fig. 2

Microstructures of the as-cast Cu-4Ti-1CNTs sample (a, b) Microstructures; (c, d) EDS analysis results of points 1 and 2 shown in (b). CNTs, carbon nanotubes; EDS, energy dispersion spectroscopy
Microstructures of the as-cast Cu-4Ti-1CNTs sample (a, b) Microstructures; (c, d) EDS analysis results of points 1 and 2 shown in (b). CNTs, carbon nanotubes; EDS, energy dispersion spectroscopy

Fig. 3

EDS analysis of the as-cast Cu-4Ti-1C sample (a) SEM image; (b–d) mapping micrographs for the elements C, Cu, and Ti. EDS, energy dispersion spectroscopy; SEM, scanning electron microscopy
EDS analysis of the as-cast Cu-4Ti-1C sample (a) SEM image; (b–d) mapping micrographs for the elements C, Cu, and Ti. EDS, energy dispersion spectroscopy; SEM, scanning electron microscopy

Fig. 4

The XRD results of the powders extracted from (a) Cu-4Ti-1C; (b) Cu-6.67Ti-1C; (c) Cu-4Ti-1C-1Si. XRD, X-ray diffraction analysis
The XRD results of the powders extracted from (a) Cu-4Ti-1C; (b) Cu-6.67Ti-1C; (c) Cu-4Ti-1C-1Si. XRD, X-ray diffraction analysis

Fig. 5

Microstructures of the electrolytic etching Cu-4Ti-1C sample (a) Low magnification microstructure; (b–d) High magnification microstructures of the TiC agglomerations
Microstructures of the electrolytic etching Cu-4Ti-1C sample (a) Low magnification microstructure; (b–d) High magnification microstructures of the TiC agglomerations

Fig. 6

The morphologies of TiC extracted from the Cu-4Ti-1C sample (a, b) The formed TiC shells; (c, d) The agglomerations of TiC; Insert figure in (d): Unreacted CNTs
The morphologies of TiC extracted from the Cu-4Ti-1C sample (a, b) The formed TiC shells; (c, d) The agglomerations of TiC; Insert figure in (d): Unreacted CNTs

Fig. 7

The agglomerations of TiC in Cu-4Ti-1C (a) The synthesized TiC agglomeration with the surface morphology similar to that of the CNTs agglomeration; (b) The formed TiC with a certain aspect ratio. CNTs, carbon nanotubes
The agglomerations of TiC in Cu-4Ti-1C (a) The synthesized TiC agglomeration with the surface morphology similar to that of the CNTs agglomeration; (b) The formed TiC with a certain aspect ratio. CNTs, carbon nanotubes

Fig. 8

Microstructures of the Cu-6.67Ti-1C sample (a, b) as-cast sample; (c, d) electrolytic etching sample
Microstructures of the Cu-6.67Ti-1C sample (a, b) as-cast sample; (c, d) electrolytic etching sample

Fig. 9

EDS analysis of the as-cast Cu-6.67Ti-1C sample (a) SEM image; (b–d) mapping micrographs for the elements C, Cu, and Ti. EDS, energy dispersion spectroscopy; SEM, scanning electron microscopy
EDS analysis of the as-cast Cu-6.67Ti-1C sample (a) SEM image; (b–d) mapping micrographs for the elements C, Cu, and Ti. EDS, energy dispersion spectroscopy; SEM, scanning electron microscopy

Fig. 10

Microstructures of the Cu-4Ti-1C-1Si sample (a, b) as-cast sample; (c, d) electrolytic etching sample
Microstructures of the Cu-4Ti-1C-1Si sample (a, b) as-cast sample; (c, d) electrolytic etching sample

Fig. 11

EDS analysis of the as-cast Cu-4Ti-1C-1Si sample (a) SEM image; (b–e) mapping micrographs for the elements C, Si, Ti, and Cu. (f) EDS point analysis result of point 3 in (a). EDS, energy dispersion spectroscopy; SEM, scanning electron microscopy
EDS analysis of the as-cast Cu-4Ti-1C-1Si sample (a) SEM image; (b–e) mapping micrographs for the elements C, Si, Ti, and Cu. (f) EDS point analysis result of point 3 in (a). EDS, energy dispersion spectroscopy; SEM, scanning electron microscopy

Fig. 12

EDS analysis of the electrolytic etching Cu-4Ti-1C-1Si sample (a) SEM image; (b) EDS point analysis result of point 4 in (a). EDS, energy dispersion spectroscopy; SEM, scanning electron microscopy
EDS analysis of the electrolytic etching Cu-4Ti-1C-1Si sample (a) SEM image; (b) EDS point analysis result of point 4 in (a). EDS, energy dispersion spectroscopy; SEM, scanning electron microscopy

Fig. 13

The volume fraction of TiC in the different composites
The volume fraction of TiC in the different composites

Fig. 14

TiC size distribution statistics (a) Cu-4Ti-1C; (b) Cu-6.67Ti-1C; (c) Cu-4Ti-1C-1Si
TiC size distribution statistics (a) Cu-4Ti-1C; (b) Cu-6.67Ti-1C; (c) Cu-4Ti-1C-1Si

Fig. 15

The properties of the as-cast composites (a) Hardness of the composites; (b) Hardness of Cu matrix; (c) Electrical conductivity
The properties of the as-cast composites (a) Hardness of the composites; (b) Hardness of Cu matrix; (c) Electrical conductivity

Fig. 16

The EDS point analysis result of Cu matrix in the as-cast composites (a) Cu-4Ti-1C; (b) Cu-6.67Ti-1C; (c) Cu-4Ti-1C-1Si. EDS, energy dispersion spectroscopy
The EDS point analysis result of Cu matrix in the as-cast composites (a) Cu-4Ti-1C; (b) Cu-6.67Ti-1C; (c) Cu-4Ti-1C-1Si. EDS, energy dispersion spectroscopy
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