<abstract xmlns="http://www.w3.org/1999/xhtml"><p>Charge-carrier transport in the channel of bottom gate, top contact organic field effect transistors with anisotropic layers of 6,13-bis(triisopropylsilylethynyl) pentacene (TIPS-Pentacene) obtained by zone casting was investigated using scanning Kelvin probe microscopy combined with atomic force microscopy. The TIPS-Pentacene continuous layers consisted of thin crystals unidirectionally oriented in the channel. Devices with perpendicular and parallel charge flow in the transistor channel were prepared. It was found that irregularities in the surface morphology at the semiconductor layer in the transistor channel are correlated with the local potential profile, and that the channel resistance strongly depends on the orientation of the TIPS-Pentacene crystals.</p></abstract>

Charge-carrier transport in the channel of bottom gate, top contact organic field effect transistors with anisotropic layers of 6,13-bis(triisopropylsilylethynyl) pentacene (TIPS-Pentacene) obtained by zone casting was investigated using scanning Kelvin probe microscopy combined with atomic force microscopy. The TIPS-Pentacene continuous layers consisted of thin crystals unidirectionally oriented in the channel. Devices with perpendicular and parallel charge flow in the transistor channel were prepared. It was found that irregularities in the surface morphology at the semiconductor layer in the transistor channel are correlated with the local potential profile, and that the channel resistance strongly depends on the orientation of the TIPS-Pentacene crystals.

Correlation between surface morphology and potential profile in OFETs with zone-cast TIPS-Pentacene as seen by scanning Kelvin probe microscopy

Materials Science-Poland

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

Charge-carrier transport in the channel of bottom gate, top contact organic field effect transistors with anisotropic layers of...

Correlation between surface morphology and potential profile in OFETs with zone-cast TIPS-Pentacene as seen by scanning Kelvin probe microscopy

Publicado en línea: 02 ago 2019

Páginas: 249 - 256

Recibido: 30 jul 2018

Aceptado: 12 mar 2019

DOI: https://doi.org/10.2478/msp-2019-0026

Palabras clave
organic field effect transistors, scanning Kelvin probe microscopy, zone casting

© 2019 M. Kucinska et al., published by Sciendo

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

Correlation between surface morphology and potential profile in OFETs with zone-cast TIPS-Pentacene as seen by scanning Kelvin probe microscopy

Publicado en línea: 02 ago 2019

Páginas: 249 - 256

Recibido: 30 jul 2018

Aceptado: 12 mar 2019

DOI: https://doi.org/10.2478/msp-2019-0026

Palabras claveorganic field effect transistors, scanning Kelvin probe microscopy, zone casting

© 2019 M. Kucinska et al., published by Sciendo

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

Palabras clave
organic field effect transistors, scanning Kelvin probe microscopy, zone casting