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The Fast Method for Correction of Distortion on Infrared Marker-Based Tracking System


Cite

Haibin Wang
Institute Microelectronics of Chinese Academy of SciencesChina
Guangzhou Institutes of Advanced Technology Chinese Academy of SciencesChina
Chinese Academy of Sciences/The Chinese University of Hong Kong Shenzhen Institute of Advanced Integration Technology Shenzhen Institutes of Advanced Technology, ShenzhenChina
Qing He
Guangzhou Institutes of Advanced Technology Chinese Academy of SciencesChina
Chinese Academy of Sciences/The Chinese University of Hong Kong Shenzhen Institute of Advanced Integration Technology Shenzhen Institutes of Advanced Technology, ShenzhenChina
Guan Guan
Guangzhou Institutes of Advanced Technology Chinese Academy of SciencesChina
Chinese Academy of Sciences/The Chinese University of Hong Kong Shenzhen Institute of Advanced Integration Technology Shenzhen Institutes of Advanced Technology, ShenzhenChina
Bin Leng
Guangzhou Institutes of Advanced Technology Chinese Academy of SciencesChina
Chinese Academy of Sciences/The Chinese University of Hong Kong Shenzhen Institute of Advanced Integration Technology Shenzhen Institutes of Advanced Technology, ShenzhenChina
Dewen Zeng
Guangzhou Institutes of Advanced Technology Chinese Academy of SciencesChina
Chinese Academy of Sciences/The Chinese University of Hong Kong Shenzhen Institute of Advanced Integration Technology Shenzhen Institutes of Advanced Technology, ShenzhenChina
eISSN:
1178-5608
Idioma:
Inglés
Calendario de la edición:
Volume Open
Temas de la revista:
Engineering, Introductions and Overviews, other