<abstract xmlns="http://www.w3.org/1999/xhtml"><p>If a piezoelectric material is deformed, the local electric field is caused by the electromechanical interaction. When a structural element with surface defects is subjected to the stress, the strain distribution appears also on the opposite surface to the defects. Such localized strain distribution can be measured by the electric potential distribution on a piezoelectric film mounted on the smooth surface. This paper shows that back-surface defects in typical structural elements can be visualized by mounted PVDF thin film</p></abstract>

If a piezoelectric material is deformed, the local electric field is caused by the electromechanical interaction. When a structural element with surface defects is subjected to the stress, the strain distribution appears also on the opposite surface to the defects. Such localized strain distribution can be measured by the electric potential distribution on a piezoelectric film mounted on the smooth surface. This paper shows that back-surface defects in typical structural elements can be visualized by mounted PVDF thin film

Intelligent Structural Elements Covered By Piezoelectric High-Polymer Film

International Journal on Smart Sensing and Intelligent Systems

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.

{"article-title":"Intelligent Structural Elements Covered By Piezoelectric High-Polymer Film"}

If a piezoelectric material is deformed, the local electric field is caused by the electromechanical interaction. When a structural element with surface...

Intelligent Structural Elements Covered By Piezoelectric High-Polymer Film

Publicado en línea: 13 dic 2017

Páginas: 420 - 429

DOI: https://doi.org/10.21307/ijssis-2017-298

Palabras clave
Piezoelectric material, surface defects, nondestructive evaluation technique, structural elements

© 2008 Eiji Matsumoto et al., published by Sciendo

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.

Intelligent Structural Elements Covered By Piezoelectric High-Polymer Film

Publicado en línea: 13 dic 2017

Páginas: 420 - 429

DOI: https://doi.org/10.21307/ijssis-2017-298

Palabras clavePiezoelectric material, surface defects, nondestructive evaluation technique, structural elements

© 2008 Eiji Matsumoto et al., published by Sciendo

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.

Palabras clave
Piezoelectric material, surface defects, nondestructive evaluation technique, structural elements