Cite

Jun Luo
Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China
2University of Chinese Academy of Sciences, Beijing 10049, China
Zhiqian Wang
Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China
Chengwu Shen
Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China
University of Chinese Academy of Sciences, Beijing 10049, China
Zhuoman Wen
Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China
University of Chinese Academy of Sciences, Beijing 10049, China
Shaojin Liu
Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China
Sheng Cai
Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China
Jianrong Li
Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China
eISSN:
1335-8871
Idioma:
Inglés
Calendario de la edición:
6 veces al año
Temas de la revista:
Engineering, Electrical Engineering, Control Engineering, Metrology and Testing