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Structural and electrical properties of chromium substituted nickel ferrite by conventional ceramic method


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Figure 1

X-ray diffraction pattern for the NiCrxFe2−xO4 system sintered at 1350 °C.
X-ray diffraction pattern for the NiCrxFe2−xO4 system sintered at 1350 °C.

Figure 2

Variation of lattice parameters with the concentration of Cr for the NiCrxFe2−xO4 system sintered at 1350 °C.
Variation of lattice parameters with the concentration of Cr for the NiCrxFe2−xO4 system sintered at 1350 °C.

Figure 3

Variation of DC resistivity with temperature for the NiCrxFe2−xO4 system sintered at 1350 °C.
Variation of DC resistivity with temperature for the NiCrxFe2−xO4 system sintered at 1350 °C.

Figure 4

logρ vs. 1/T curve of the NiCrxFe2−xO4 system sintered at 1350 °C for measuring the activation energy.
logρ vs. 1/T curve of the NiCrxFe2−xO4 system sintered at 1350 °C for measuring the activation energy.

Figure 5

Variation in AC resistivity with frequency for all the samples of the NiCrxFe2−xO4 system sintered at 1350 °C.
Variation in AC resistivity with frequency for all the samples of the NiCrxFe2−xO4 system sintered at 1350 °C.

Figure 6

Variation of dielectric constant with frequency of the NiCrxFe2−xO4 system sintered at 1350 °C.
Variation of dielectric constant with frequency of the NiCrxFe2−xO4 system sintered at 1350 °C.

Figure 7

Variation of loss tangent with frequency for the NiCrxFe2−xO4 system sintered at 1350°C.
Variation of loss tangent with frequency for the NiCrxFe2−xO4 system sintered at 1350°C.

Lattice parameter, X-ray density, bulk density, porosity and activation energy for NiCrxFe2−xO4 sintered at 1350°C.

ConcentrationLattice parameterX-ray densityBulk densityPorosityActivation energy
x a [ Å]ρx [g/cm3]ρb [g/cm3]P [%]EfEpΔE = Ep − Ef
0.08.3395.4524.51517.200.141.741.60
0.28.3325.4454.57715.940.132.312.18
0.48.3215.4454.39819.230.101.941.84
0.68.3205.4254.27221.260.340.960.62
0.88.3175.4104.28420.810.401.030.63
1.08.3095.4044.09024.320.361.190.83
eISSN:
2083-134X
Idioma:
Inglés
Calendario de la edición:
4 veces al año
Temas de la revista:
Materials Sciences, other, Nanomaterials, Functional and Smart Materials, Materials Characterization and Properties