Cite

[1] GINLEY D.S., BRIGHT C., MRS Bull., 25 (2000), 15.10.1557/mrs2000.256Search in Google Scholar

[2] HARTNAGEL H.L., DAWAR A.L., JAIN A.K., JAGADISH C., Semiconducting transparent thin films, Institute of Physics Publishing, Bristol, 1995.Search in Google Scholar

[3] BEYER W., HÜPKES J., STIEBIG H., Thin Solid Films, 516 (2007), 147.10.1016/j.tsf.2007.08.110Search in Google Scholar

[4] JUNG Y.S., LEE D.W., JEON D.Y., Appl. Surf. Sci., 221, (2004) 136.10.1016/S0169-4332(03)00862-6Search in Google Scholar

[5] JAN S.W., LEE S.C., J. Electrochem. Soc., 134 (8) (1987), 2056.10.1149/1.2100819Search in Google Scholar

[6] HOLMELUND E., THESTRUP B., SCHOU J., LARSEN N.B., NIELSEN M.M., JOHNSON E., TOUGAARD S., Appl. Phys. A, 74 (2002), 147.10.1007/s003390100976Search in Google Scholar

[7] WILLEY R.R., Practical Production of Optical Thin Films, Vol. 2, Willey Optical, Consultants, Charleviox, 2008.Search in Google Scholar

[8] THEISS W., SCOUT Software, www.mtheiss.com.Search in Google Scholar

[9] HAACKE G., J. Appl. Phys., 47 (1976), 4086.10.1063/1.323240Search in Google Scholar

eISSN:
2083-134X
Idioma:
Inglés
Calendario de la edición:
4 veces al año
Temas de la revista:
Materials Sciences, other, Nanomaterials, Functional and Smart Materials, Materials Characterization and Properties