Phase, microstructure and microwave dielectric properties of Mg_0:95Ni_0:05Ti_0:98Zr_0:02O₃ ceramics

Mg_0:95Ni_0:05Ti_0:98Zr_0:02O₃ ceramics was prepared via conventional solid-state mixed-oxide route. The phase, microstructure and microwave dielectric properties of the sintered samples were characterized using X-ray diffraction (XRD), scanning electron microscopy (SEM) and a vector network analyzer. The microstructure comprised of circular and elongated plate-like grains. The semi quantitative analysis (EDS) of the circular and elongated grains revealed the existence of Mg_0:95Ni_0:05T₂O₅ as a secondary phase along with the parent Mg_0:95Ni_0:05Ti_0:98Zr_0:02O₃ phase, which was consistent with the XRD findings. In the present study, ε_r ~17.1, Q_uf_o~195855 ± 2550 GHz and τ_f ~ -46 ppm/K was achieved for the synthesized Mg_0:95Ni_0:05Ti_0:98Zr_0:02O₃ ceramics sintered at 1325 °C for 4 h.