<abstract xml:lang="en" xmlns="http://www.w3.org/1999/xhtml"><p>In the paper we present an overview of the latest progress in the conventional lift-mode magnetic force microscopy (MFM) technique, achieved by advanced MFM tips and by lowering the lift height. Although smaller lift height offers improved spatial resolution, we show that lowered tip-sample distance mixes magnetic, atomic and electric forces. We describe an alternative to the lift-mode procedure - Switching Magnetization Magnetic Force Microscopy [SM-MFM], which is based on two-pass scanning in tapping mode AFM with reversed tip magnetization between the scans. We propose design and calculate the magnetic properties of such SM-MFM tips. For best performance the tips must exhibit low magnetic moment, low switching field, and single-domain state at remanence. The switching field of such tips is calculated for Permalloy hexagons.</p></abstract>

In the paper we present an overview of the latest progress in the conventional lift-mode magnetic force microscopy (MFM) technique, achieved by advanced MFM tips and by lowering the lift height. Although smaller lift height offers improved spatial resolution, we show that lowered tip-sample distance mixes magnetic, atomic and electric forces. We describe an alternative to the lift-mode procedure - Switching Magnetization Magnetic Force Microscopy [SM-MFM], which is based on two-pass scanning in tapping mode AFM with reversed tip magnetization between the scans. We propose design and calculate the magnetic properties of such SM-MFM tips. For best performance the tips must exhibit low magnetic moment, low switching field, and single-domain state at remanence. The switching field of such tips is calculated for Permalloy hexagons.

Switching Magnetization Magnetic Force Microscopy — An Alternative to Conventional Lift-Mode MFM

Institute of Electrical Engineering, Slovak Academy of Sciences, Dúbravská cesta 9, 841 04 Bratislava, Slovakia

Institute of Informatics, Slovak Academy of Sciences, Dúbravská cesta 9, 841 04 Bratislava, Slovakia

Institute of Measurement Science, Slovak Academy of Sciences, Dúbravská cesta 9, 841 04 Bratislava, Slovakia

Faculty of Electrical Engineering and Information technology, Slovak University of Technology, Ilkovičova 3, 812 19 Bratislava, Slovakia

Journal of Electrical Engineering

In the paper we present an overview of the latest progress in the conventional lift-mode magnetic force microscopy (MFM) technique, achieved by advanced MFM...

Switching Magnetization Magnetic Force Microscopy — An Alternative to Conventional Lift-Mode MFM

Online veröffentlicht: 07. Juni 2011

Seitenbereich: 37 - 43

DOI: https://doi.org/10.2478/v10187-011-0006-2

Schlüsselwörter
magnetic force microscopy, micromagnetic calculations, switching field

This content is open access.

Switching Magnetization Magnetic Force Microscopy — An Alternative to Conventional Lift-Mode MFM

Online veröffentlicht: 07. Juni 2011

Seitenbereich: 37 - 43

DOI: https://doi.org/10.2478/v10187-011-0006-2

Schlüsselwörtermagnetic force microscopy, micromagnetic calculations, switching field

This content is open access.

Schlüsselwörter
magnetic force microscopy, micromagnetic calculations, switching field