<abstract xml:lang="en" xmlns="http://www.w3.org/1999/xhtml">Many semiconductor materials manufactured by help of nanotechnology have charge carriers of different type and mobility. Already existing carrier density and mobility measurement methods are not accurate enough for the case of several carrier components. The use of magnetoplasmic waves provides a simple and the most precise way to determine the density and mobility of each type of the carriers (electrons and/or holes).Magnetoplasmic waves may be excited in semiconductors when the strong magnetic field H is applied. The semiconductor sample becomes partially transparent under these conditions. In the case of magnetoplasmic resonance within each of the carrier groups, the transparency coefficient has a maximum. For fixed values H and excitation frequency ω the density and mobility of every carrier type can be found.Dispersion relation for two types of charge carriers is obtained and resonance curves are calculated.</abstract>

Many semiconductor materials manufactured by help of nanotechnology have charge carriers of different type and mobility. Already existing carrier density and mobility measurement methods are not accurate enough for the case of several carrier components. The use of magnetoplasmic waves provides a simple and the most precise way to determine the density and mobility of each type of the carriers (electrons and/or holes).Magnetoplasmic waves may be excited in semiconductors when the strong magnetic field H is applied. The semiconductor sample becomes partially transparent under these conditions. In the case of magnetoplasmic resonance within each of the carrier groups, the transparency coefficient has a maximum. For fixed values H and excitation frequency ω the density and mobility of every carrier type can be found.Dispersion relation for two types of charge carriers is obtained and resonance curves are calculated.

The Magnetoplasmic Measurements of the Carrier Density in Many-Component Solid State Plasma

Department of Electrical Engineering, Vilnius Gediminas Technical University, Sauletekio av. 11, LT 10223, Vilnius, Lithuania

Department of Electrical Engineering, Vilnius Gediminas Technical University, Sauletekio av. 11, LT 10223

Computer Software Department, Vilnius College in Higher Education, J. Jasinskio Str. 15, LT 2600, Vilnius, Lithuania

Measurement Science Review

Many semiconductor materials manufactured by help of nanotechnology have charge carriers of different type and mobility. Already existing carrier density and...

The Magnetoplasmic Measurements of the Carrier Density in Many-Component Solid State Plasma

Online veröffentlicht: 21. Juli 2009

Seitenbereich: 71 - 74

DOI: https://doi.org/10.2478/v10048-009-0013-7

Schlüsselwörter
Magnetic measurement, imaging, magnetic susceptibility, helicons, calculation, microwave frequencies

This content is open access.

The Magnetoplasmic Measurements of the Carrier Density in Many-Component Solid State Plasma

Online veröffentlicht: 21. Juli 2009

Seitenbereich: 71 - 74

DOI: https://doi.org/10.2478/v10048-009-0013-7

SchlüsselwörterMagnetic measurement, imaging, magnetic susceptibility, helicons, calculation, microwave frequencies

This content is open access.

Schlüsselwörter
Magnetic measurement, imaging, magnetic susceptibility, helicons, calculation, microwave frequencies