<abstract xml:lang="en" xmlns="http://www.w3.org/1999/xhtml"><p>A procedure for surface processing of TlBr crystals to be applied as X-and ?-ray detectors has been developed, providing removal of a mechanically destroyed surface layer by deep chemical etching, allowing the surfaces of good topography and thus the detectors with high energy resolution and stability to be obtained in a repeatable way. The surface quality and structural changes in the near-surface layer are estimated by the optical microscopy and indentation hardness technique.</p></abstract>

A procedure for surface processing of TlBr crystals to be applied as X-and ?-ray detectors has been developed, providing removal of a mechanically destroyed surface layer by deep chemical etching, allowing the surfaces of good topography and thus the detectors with high energy resolution and stability to be obtained in a repeatable way. The surface quality and structural changes in the near-surface layer are estimated by the optical microscopy and indentation hardness technique.

Surface Processing of TlBr Crystals for X- and γ-ray Detectors

Baltic Scientific Instruments, 26 Ganibu dambis Str., LV-1005 Riga, LATVIA

Institute of Solid State Physics, University of Latvia, 8 Kengaraga Str., LV-1063, Riga, LATVIA

Latvian Journal of Physics and Technical Sciences

{"article-title":"Surface Processing of TlBr Crystals for X- and γ-ray Detectors"}

A procedure for surface processing of TlBr crystals to be applied as X-and ?-ray detectors has been developed, providing removal of a mechanically destroyed...

Surface Processing of TlBr Crystals for X- and γ-ray Detectors

Online veröffentlicht: 14. Aug. 2008

Seitenbereich: 43 - 49

DOI: https://doi.org/10.2478/v10047-008-0012-8

Schlüsselwörter
TlBr crystals, surface processing, micro-hardness

This content is open access.

Surface Processing of TlBr Crystals for X- and γ-ray Detectors

Online veröffentlicht: 14. Aug. 2008

Seitenbereich: 43 - 49

DOI: https://doi.org/10.2478/v10047-008-0012-8

SchlüsselwörterTlBr crystals, surface processing, micro-hardness

This content is open access.

Schlüsselwörter
TlBr crystals, surface processing, micro-hardness