<abstract xml:lang="en" xmlns="http://www.w3.org/1999/xhtml"><p>The mono and bi-layer TiO2 thin films have been prepared by sol-gel method on glass. X-Ray diffraction, Raman spectroscopy, atomic force microscopy, spectroscopic ellipsometry and m-lines spectroscopy techniques have been used to characterize the TiO2 films. The mono-layer film is found to be amorphous, while the bi-layer film shows the presence of anatase phase. The bi-layer film exhibits more homogeneous surface with less roughness. The thickness effect on the refractive index, extinction ceofficient, packing density and optical band gap is analysed. The waveguiding measurements of the bi-layer film exhibit single-guided TE0 and TM0 polarized modes from which we can measure the refractive index and the film thickness.</p></abstract>

The mono and bi-layer TiO2 thin films have been prepared by sol-gel method on glass. X-Ray diffraction, Raman spectroscopy, atomic force microscopy, spectroscopic ellipsometry and m-lines spectroscopy techniques have been used to characterize the TiO2 films. The mono-layer film is found to be amorphous, while the bi-layer film shows the presence of anatase phase. The bi-layer film exhibits more homogeneous surface with less roughness. The thickness effect on the refractive index, extinction ceofficient, packing density and optical band gap is analysed. The waveguiding measurements of the bi-layer film exhibit single-guided TE0 and TM0 polarized modes from which we can measure the refractive index and the film thickness.

Structural and optical properties of TiO2 thin films grown by sol-gel dip coating process

Laboratoire Couches Minces et Interfaces, Université Constantine 1, Constantine, 25000, Algérie

Groupe d’Etude de la Matičre Condensée, CNRS-Université de Versailles/St. Quentin en Yvlines, 45 Avenue des Etats Unis, F78035, Versailles Cedex, France

Materials Science-Poland

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

The mono and bi-layer TiO2 thin films have been prepared by sol-gel method on glass. X-Ray diffraction, Raman spectroscopy, atomic force microscopy,...

Structural and optical properties of TiO2 thin films grown by sol-gel dip coating process

Online veröffentlicht: 26. März 2014

Seitenbereich: 1 - 6

DOI: https://doi.org/10.2478/s13536-013-0147-z

Schlüsselwörter
TiO2, anatase, AFM, ellipsometry, m-lines

© 2014 Wroclaw University of Technology

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

Structural and optical properties of TiO2 thin films grown by sol-gel dip coating process

Online veröffentlicht: 26. März 2014

Seitenbereich: 1 - 6

DOI: https://doi.org/10.2478/s13536-013-0147-z

SchlüsselwörterTiO2, anatase, AFM, ellipsometry, m-lines

© 2014 Wroclaw University of Technology

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

Schlüsselwörter
TiO2, anatase, AFM, ellipsometry, m-lines