<abstract xmlns="http://www.w3.org/1999/xhtml">

<p>The paper presents a possible application of integrated LabVIEW environment to the final evaluation of measurement results in direct measurement. The possibilities of presenting and visualizing the uncertainty of measurement results in a convenient and user-friendly form are also discussed. The topics discussed in the paper were presented using a developed application in LabVIEW. The paper discusses the topic of measurement of direct voltages in the presence of strong electromagnetic interferences. These problems are frequently omitted or hardly emphasized. It presents a suitable measuring system, a virtual measuring instrument created in the LabVIEW environment, and the results of tests carried out for an example NI PCI-6221 data acquisition board. The described approach can be applied also in other measurement situations.</p>
</abstract>

The paper presents a possible application of integrated LabVIEW environment to the final evaluation of measurement results in direct measurement. The possibilities of presenting and visualizing the uncertainty of measurement results in a convenient and user-friendly form are also discussed. The topics discussed in the paper were presented using a developed application in LabVIEW. The paper discusses the topic of measurement of direct voltages in the presence of strong electromagnetic interferences. These problems are frequently omitted or hardly emphasized. It presents a suitable measuring system, a virtual measuring instrument created in the LabVIEW environment, and the results of tests carried out for an example NI PCI-6221 data acquisition board. The described approach can be applied also in other measurement situations.

The Evaluation of Expanded Uncertainty of DC Voltages in the Presence of Electromagnetic Interferences using the LabVIEW Environment

Institute of Electrical Engineering and Electronics, Faculty of Control, Robotics and Electrical Engineering

Department of Automation and Metrology, Faculty of Electrical Engineering and Computer Science

Department of Metrology and Measurement Systems, Faculty of Electrical and Computer Engineering

Measurement Science Review

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.

The paper presents a possible application of integrated LabVIEW environment to the final evaluation of measurement results in direct measurement. The...

The Evaluation of Expanded Uncertainty of DC Voltages in the Presence of Electromagnetic Interferences using the LabVIEW Environment

Online veröffentlicht: 17. Sept. 2021

Seitenbereich: 136 - 141

Eingereicht: 09. Juli 2021

Akzeptiert: 25. Aug. 2021

DOI: https://doi.org/10.2478/msr-2021-0019

Schlüsselwörter
Expanded uncertainty, probability distribution, virtual instrument, electromagnetic interference

© 2021 Przemysław Otomański et al., published by Sciendo

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.

The Evaluation of Expanded Uncertainty of DC Voltages in the Presence of Electromagnetic Interferences using the LabVIEW Environment

Online veröffentlicht: 17. Sept. 2021

Seitenbereich: 136 - 141

Eingereicht: 09. Juli 2021

Akzeptiert: 25. Aug. 2021

DOI: https://doi.org/10.2478/msr-2021-0019

SchlüsselwörterExpanded uncertainty, probability distribution, virtual instrument, electromagnetic interference

© 2021 Przemysław Otomański et al., published by Sciendo

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.

Schlüsselwörter
Expanded uncertainty, probability distribution, virtual instrument, electromagnetic interference