<abstract xmlns="http://www.w3.org/1999/xhtml">

<p>The Generalized Morse Wavelet (GMW) algorithm was adapted to determine the refractive index of dielectric film from the reflectance spectrum. A theoretically generated reflectance spectrum in the range of 300-1200 nm wavelength was analyzed by the Continuous Wavelet Transform (CWT) and the refractive index dispersion was obtained by the mentioned method. In addition, a noisy reflectance spectrum was analyzed to show the advantages of the CWT method. Refractive index dispersions calculated by the Morlet and the Paul wavelet were compared to GMW at the end of the study.</p>
</abstract>

The Generalized Morse Wavelet (GMW) algorithm was adapted to determine the refractive index of dielectric film from the reflectance spectrum. A theoretically generated reflectance spectrum in the range of 300-1200 nm wavelength was analyzed by the Continuous Wavelet Transform (CWT) and the refractive index dispersion was obtained by the mentioned method. In addition, a noisy reflectance spectrum was analyzed to show the advantages of the CWT method. Refractive index dispersions calculated by the Morlet and the Paul wavelet were compared to GMW at the end of the study.

An Improved Method for Determination of Refractive Index of Dielectric Films from Reflectance Spectrum by Using the Generalized Morse Wavelet

Department of Physics, Faculty of Arts and Sciences

Measurement Science Review

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

The Generalized Morse Wavelet (GMW) algorithm was adapted to determine the refractive index of dielectric film from the reflectance spectrum. A theoretically...

An Improved Method for Determination of Refractive Index of Dielectric Films from Reflectance Spectrum by Using the Generalized Morse Wavelet

Online veröffentlicht: 21. Mai 2021

Seitenbereich: 61 - 66

Eingereicht: 23. März 2021

Akzeptiert: 03. Mai 2021

DOI: https://doi.org/10.2478/msr-2021-0009

Schlüsselwörter
Dielectric film, refractive index, reflectance spectrum, continuous wavelet transform, generalized Morse wavelet

© 2021 Erhan Tiryaki et al., published by Sciendo

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

An Improved Method for Determination of Refractive Index of Dielectric Films from Reflectance Spectrum by Using the Generalized Morse Wavelet

Online veröffentlicht: 21. Mai 2021

Seitenbereich: 61 - 66

Eingereicht: 23. März 2021

Akzeptiert: 03. Mai 2021

DOI: https://doi.org/10.2478/msr-2021-0009

SchlüsselwörterDielectric film, refractive index, reflectance spectrum, continuous wavelet transform, generalized Morse wavelet

© 2021 Erhan Tiryaki et al., published by Sciendo

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 3.0 License.

Schlüsselwörter
Dielectric film, refractive index, reflectance spectrum, continuous wavelet transform, generalized Morse wavelet