<abstract xmlns="http://www.w3.org/1999/xhtml"> We present the development, realization and setup of dielectric resonators, for the purpose of measuring the surface impedance at microwave frequencies of superconducting thin films. We focus on resonators designed to operate in dc magnetic fields, optimized for the measurements of the variation of the surface impedance with the applied field. Two resonators, operating at 8 and 48 GHz, are presented. We discuss different approaches to the measurement of the resonator parameters, with particular attention to the nonidealities of real setups in a cryogenic environment. Finally, we present some sample measurement of high-Tc and low-Tc superconducting films.</abstract>

We present the development, realization and setup of dielectric resonators, for the purpose of measuring the surface impedance at microwave frequencies of superconducting thin films. We focus on resonators designed to operate in dc magnetic fields, optimized for the measurements of the variation of the surface impedance with the applied field. Two resonators, operating at 8 and 48 GHz, are presented. We discuss different approaches to the measurement of the resonator parameters, with particular attention to the nonidealities of real setups in a cryogenic environment. Finally, we present some sample measurement of high-Tc and low-Tc superconducting films.

Dielectric Resonators for the Measurements of the Surface Impedance of Superconducting Films

Dipartimento di Ingegneria, Università Roma Tre, Via della Vasca Navale 84, 00146 Roma, Italy

Measurement Science Review

This article is distributed under the terms of the Creative Commons Attribution Non-Commercial License, which permits unrestricted non-commercial use, distribution, and reproduction in any medium, provided the original work is properly cited.

We present the development, realization and setup of dielectric resonators, for the purpose of measuring the surface impedance at microwave frequencies of...

Dielectric Resonators for the Measurements of the Surface Impedance of Superconducting Films

Online veröffentlicht: 17. Juni 2014

Seitenbereich: 164 - 170

Eingereicht: 25. Juli 2013

Akzeptiert: 20. Mai 2014

DOI: https://doi.org/10.2478/msr-2014-0022

Schlüsselwörter
Microwave methods, dielectric resonators, superconductors, surface impedance, thin films, low temperature

© by E. Silva

This article is distributed under the terms of the Creative Commons Attribution Non-Commercial License, which permits unrestricted non-commercial use, distribution, and reproduction in any medium, provided the original work is properly cited.

Dielectric Resonators for the Measurements of the Surface Impedance of Superconducting Films

Online veröffentlicht: 17. Juni 2014

Seitenbereich: 164 - 170

Eingereicht: 25. Juli 2013

Akzeptiert: 20. Mai 2014

DOI: https://doi.org/10.2478/msr-2014-0022

SchlüsselwörterMicrowave methods, dielectric resonators, superconductors, surface impedance, thin films, low temperature

© by E. Silva

This article is distributed under the terms of the Creative Commons Attribution Non-Commercial License, which permits unrestricted non-commercial use, distribution, and reproduction in any medium, provided the original work is properly cited.

Schlüsselwörter
Microwave methods, dielectric resonators, superconductors, surface impedance, thin films, low temperature