Some remarks on the paper “Optimization of S:Sn precursor molar concentration on the physical properties of spray deposited single phase Sn₂S₃ thin films” by J. Srivind, V.S. Nagaretthinam, A.R. Balu [Mater. Sci.-Poland, 34 (2016), 393 – 398]

Online veröffentlicht: 12. Dez. 2020

Seitenbereich: 400 - 401

Eingereicht: 14. Apr. 2018

Akzeptiert: 13. Nov. 2018

DOI: https://doi.org/10.2478/msp-2018-0101

Schlüsselwörter

X-ray diffraction, thin films, errors, SnS

© 2020 Paweł E. Tomaszewski, published by Sciendo

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.