Radiation-Stimulated Changes in the Characteristics of Surface-Barrier Al–Si–Bi Structures with Different Concentrations of Dislocations at the Crystal Surface
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04. Apr. 2018
Über diesen Artikel
Online veröffentlicht: 04. Apr. 2018
Seitenbereich: 72 - 77
Eingereicht: 06. Juni 2016
Akzeptiert: 22. März 2018
DOI: https://doi.org/10.2478/ama-2018-0012
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© 2018 Bohdan Pavlyk et al., published by De Gruyter Open
This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.
Pavlyk, Bohdan
Faculty of Electronics, Lviv Ivan Franko National UniversityLviv, Ukraine
Kushlyk, Markijan
Faculty of Electronics, Lviv Ivan Franko National UniversityLviv, Ukraine
Slobodzyan, Dmytro
Faculty of Electronics, Lviv Ivan Franko National UniversityLviv, Ukraine
Matvijishyn, Igor
Faculty of Electronics, Lviv Ivan Franko National UniversityLviv, Ukraine
Lys, Roman
Faculty of Electronics, Lviv Ivan Franko National UniversityLviv, Ukraine
Jałbrzykowski, Marek
Bialystok University of Technology, Faculty of Mechanical EngineeringBialystok, Poland