Magnetic and Transport properties of Co-Cu Microwires

We report on the magnetic, transport and structural properties of Cox-Cu100-x (5≤x≤40) glass-coated microwires. For x=5 we observed the resistivity minimum at 40 K associated with the Kondo effect. For x ? 10 we observed considerable magnetoresistance effect. Temperature dependence of susceptibility show considerable difference for x>10 and x≤ 10 attributed to the presence of small Co grains embedded in the Cu matrix for x? 10. Using X-ray diffraction we found, that the structure of Cox-Cu100-x microwires x ? 10 is granular consisting of two phases: fcc Cu appearing in all the samples and fcc α-Co presented only in microwires with higher Co content.