<abstract xmlns="http://www.w3.org/1999/xhtml"><p> In this paper, the selected results of measurements and analysis of the active surfaces of a new generation of coated abrasive tools obtained by the use of focus-variation microscopy (FVM) are presented and discussed. The origin of this technique, as well as its general metrological characteristics is briefly described. Additionally, information regarding the focus variation microscope used in the experiments - InfiniteFocus<sup>®</sup> IF G4 produced by Alicona Imaging, is also given. The measurements were carried out on microfinishing films (IMFF), abrasive portable belts with Cubitron™ II grains, and single-layer abrasive discs with Trizact™ grains. The obtained results were processed and analyzed employing TalyMap 4.0 software in the form of maps and profiles, surface microtopographies, Abbott- Firestone curves, and calculated values of selected areal parameters. This allowed us to describe the active surfaces of the coated abrasive tools, as well as to assess the possibility of applying the FVM technique in such kinds of measurements.</p></abstract>

In this paper, the selected results of measurements and analysis of the active surfaces of a new generation of coated abrasive tools obtained by the use of focus-variation microscopy (FVM) are presented and discussed. The origin of this technique, as well as its general metrological characteristics is briefly described. Additionally, information regarding the focus variation microscope used in the experiments - InfiniteFocus® IF G4 produced by Alicona Imaging, is also given. The measurements were carried out on microfinishing films (IMFF), abrasive portable belts with Cubitron™ II grains, and single-layer abrasive discs with Trizact™ grains. The obtained results were processed and analyzed employing TalyMap 4.0 software in the form of maps and profiles, surface microtopographies, Abbott- Firestone curves, and calculated values of selected areal parameters. This allowed us to describe the active surfaces of the coated abrasive tools, as well as to assess the possibility of applying the FVM technique in such kinds of measurements.

The Use of Focus-Variation Microscopy for the Assessment of Active Surfaces of a New Generation of Coated Abrasive Tools

Subject Group of Metrology and Quality, Department of Production Engineering, Faculty of Mechanical Engineering, Koszalin University of Technology, Racławicka 15-17, 75-620 Koszalin, Poland

Department of Production Engineering, Faculty of Mechanical Engineering, Koszalin University of Technology, Racławicka 15-17, 75-620 Koszalin, Poland

Faculty of Mechanical Engineering, Opole University of Technology, Prószkowska 76, 45-758 Opole, Poland

Measurement Science Review

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

In this paper, the selected results of measurements and analysis of the active surfaces of a new generation of coated abrasive tools obtained by the use of...

The Use of Focus-Variation Microscopy for the Assessment of Active Surfaces of a New Generation of Coated Abrasive Tools

Online veröffentlicht: 06. Mai 2016

Seitenbereich: 42 - 53

Eingereicht: 28. Dez. 2015

Akzeptiert: 22. März 2016

DOI: https://doi.org/10.1515/msr-2016-0007

Schlüsselwörter
Focus-variation microscopy, coated abrasive tools, Cubitron™ II, Trizact™, IMFF

© by Krzysztof Nadolny

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

The Use of Focus-Variation Microscopy for the Assessment of Active Surfaces of a New Generation of Coated Abrasive Tools

Online veröffentlicht: 06. Mai 2016

Seitenbereich: 42 - 53

Eingereicht: 28. Dez. 2015

Akzeptiert: 22. März 2016

DOI: https://doi.org/10.1515/msr-2016-0007

SchlüsselwörterFocus-variation microscopy, coated abrasive tools, Cubitron™ II, Trizact™, IMFF

© by Krzysztof Nadolny

This work is licensed under the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 License.

Schlüsselwörter
Focus-variation microscopy, coated abrasive tools, Cubitron™ II, Trizact™, IMFF