Uneingeschränkter Zugang

Influence of controlled deposition rate on mechanical properties of sputtered Ti thin films for MEMS application

 und    | 19. Nov. 2016

Zitieren

Patsalas P., Charitidis C., Logothetidis S., Surf. Coat. Technol., 125 (2000), 335.PatsalasP.CharitidisC.LogothetidisS.Surf. Coat. Technol125200033510.1016/S0257-8972(99)00606-4Search in Google Scholar

Travis E.Q., Fiordalice R.F., Solid Films, 236 (1993), 325.TravisE.Q.FiordaliceR.F.Solid Films236199332510.1016/0040-6090(93)90690-QSearch in Google Scholar

Gagnon G., Currie J.F., Beique C., Brebner J.L., Gujrathi S.G., Onlett L., J. Appl. Phys., 75 (1994), 1565.GagnonG.CurrieJ.F.BeiqueC.BrebnerJ.L.GujrathiS.G.OnlettL.J. Appl. Phys751994156510.1063/1.356392Search in Google Scholar

Hara T., Yamanoue A., Iio H., Inoue K., Washidzu G., Nakamura S., Jpn. J. Appl. Phys., 30 (1991), 1447.HaraT.YamanoueA.IioH.InoueK.WashidzuG.NakamuraS.Jpn. J. Appl. Phys301991144710.1143/JJAP.30.1447Search in Google Scholar

Vaz F., Ferreira J., Ribeiro E., Rebouta L., Lanceros-Mendez S., Mendez J.A., Alves E., Goudeau P., Riviere J.P., Ribeiro F., Moutinho I., Pischow K., Rijk J., Surf. Coat. Technol, 191 (2005), 317.VazF.FerreiraJ.RibeiroE.ReboutaL.Lanceros-MendezS.MendezJ.A.AlvesE.GoudeauP.RiviereJ.P.RibeiroF.MoutinhoI.PischowK.RijkJ.Surf. Coat. Technol191200531710.1016/j.surfcoat.2004.01.033Search in Google Scholar

Eriksson L., Harju E., Korhonen A.S., Pischow K., Surf. Coat. Technol., 53 (1992), 153.ErikssonL.HarjuE.KorhonenA.S.PischowK.Surf. Coat. Technol53199215310.1016/0257-8972(92)90117-SSearch in Google Scholar

Chou W.J., Yu G.P., Huang J.H., Surf Coat. Technol, 149 (2002), 7.ChouW.J.YuG.P.HuangJ.H.Surf Coat. Technol1492002710.1016/S0257-8972(01)01382-2Search in Google Scholar

Valvoda V., J. Alloy. Compd., 219 (1995), 83.ValvodaV.J. Alloy. Compd21919958310.1016/0925-8388(94)05012-0Search in Google Scholar

Baker M.A., Monclus M.A., Rebholz C., Gibson P.N., Leyland A., Matthews A., Thin Solid Films, 518, (2010), 4273.BakerM.A.MonclusM.A.RebholzC.GibsonP.N.LeylandA.MatthewsA.Thin Solid Films5182010427310.1016/j.tsf.2009.12.109Search in Google Scholar

Hainsworth S.V., Soh W.C., Surf. Coat. Technol., 163 – 164 (2003), 515.HainsworthS.V.SohW.C.Surf. Coat. Technol163 – 164200351510.1016/S0257-8972(02)00652-7Search in Google Scholar

Kumar A., Singh D., Kumar R., Kaura D., J. Alloy. Compd., 479 (2009), 166.KumarA.SinghD.KumarR.KauraD.J. Alloy. Compd479200916610.1016/j.jallcom.2008.12.116Search in Google Scholar

Holleck H., J. Vac. Sci. Technol. A, 4 (2661) (1986), 2661.HolleckH.J. Vac. Sci. Technol A426611986266110.1116/1.573700Search in Google Scholar

Savaloni H., Khojier K., Torabi S., Corros. Sci., 52 (2010), 1263.SavaloniH.KhojierK.TorabiS.Corros. Sci522010126310.1016/j.corsci.2009.11.042Search in Google Scholar

Chatterjee S., Chandrashekhar S., Sudarshan T.S., J. Mater. Sci., 27 (1992), 3409.ChatterjeeS.ChandrashekharS.SudarshanT.S.J. Mater. Sci271992340910.1007/BF01151815Search in Google Scholar

Russell S.W., Rack M.J., Adams D., Alford T.L., J. Electrochem. Soc., 143 (1996), 2349.RussellS.W.RackM.J.AdamsD.AlfordT.L.J. Electrochem. Soc1431996234910.1149/1.1837005Search in Google Scholar

Firouzi M., Savaloni H., Ghoronneviss M., Appl. Surf. Sci., 256 (2010), 4502.FirouziM.SavaloniH.GhoronnevissM.Appl. Surf. Sci2562010450210.1016/j.apsusc.2010.01.083Search in Google Scholar

Fani N., Savaloni H., J. Theor. Appl. Phys., 6 (2012), 1.FaniN.SavaloniH.J. Theor. Appl. Phys62012110.1186/2251-7235-6-1Search in Google Scholar

Wang T.G., Jeong D., Liu Y., Wang Q., Iyengar S., Melin S., Kim K.H., Surf. Coat. Technol., 206 (2012), 2638.WangT.G.JeongD.LiuY.WangQ.IyengarS.MelinS.KimK.H.Surf. Coat. Technol2062012263810.1016/j.surfcoat.2011.10.026Search in Google Scholar

Arshi N., Lu J., Joo Y.K., Lee C.G., Yoon J.H., Ahmed F., Mater. Chem. Phys., 134 (2012), 839.ArshiN.LuJ.JooY.K.LeeC.G.YoonJ.H.AhmedF.Mater. Chem. Phys134201283910.1016/j.matchemphys.2012.03.078Search in Google Scholar

Zhao J.P., Wang X., Chen Z.Y., Yang S.Q., Shi T.S., Liu X.H., J. Phys. D-Appl. Phys., 30 (1997), 5.ZhaoJ.P.WangX.ChenZ.Y.YangS.Q.ShiT.S.LiuX.H.J. Phys. D-Appl. Phys301997510.1088/0022-3727/30/1/002Search in Google Scholar

Pellegeg J., Zevin LZ., Lungo S., Thin Solid Films, 197 (1991), 117.PellegegJ.ZevinLZ.LungoS.Thin Solid Films197199111710.1016/0040-6090(91)90225-MSearch in Google Scholar

Warren B.E., X-ray Diffraction, Addison-Wesley, London, 1969.WarrenB.E.X-ray DiffractionAddison-WesleyLondon1969Search in Google Scholar

Yu G.Q., Tay B.K., Lau S.P., Prasad K., Pan L.K., Chai J.W., Lai D., Chem. Phys. Lett, 374 (2003), 264.YuG.Q.TayB.K.LauS.P.PrasadK.PanL.K.ChaiJ.W.LaiD.Chem. Phys. Lett374200326410.1016/S0009-2614(03)00719-XSearch in Google Scholar

eISSN:
2083-134X
Sprache:
Englisch
Zeitrahmen der Veröffentlichung:
4 Hefte pro Jahr
Fachgebiete der Zeitschrift:
Materialwissenschaft, andere, Nanomaterialien, Funktionelle und Intelligente Materialien, Charakterisierung und Eigenschaften von Materialien